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Topic: Atomic force microscopy

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	atomic force microscopy - a Whatis.com definition - see also: AFM (Site not responding. Last check: 2007-10-09)
		Atomic force microscopy (AFM) is a technique for analyzing the surface of a rigid material all the way down to the level of the atom.
		AFM uses a mechanical probe to magnify surface features up to 100,000,000 times, and it produces 3-D images of the surface.
		AFM is being used to understand materials problems in many areas, including data storage, telecommunications, biomedicine, chemistry, and aerospace.
	whatis.techtarget.com /definition/0,,sid9_gci214451,00.html (325 words)

	Atomic Force Microscope, and other Atomic Force Microscope information (Site not responding. Last check: 2007-10-09)
		The basic atomic force microscope is composed of a stylus-cantilever probe attached to the probe stage...
		The atomic force microscope (AFM), or scanning force microscope (SFM) was invented in 1986 by Binnig, Quate and...
		second generation of scanning probe microscopy was ushered in by the advent of the atomic force microscope (AFM) in 1986...
	www.maxiscopes.co.uk /directory/atomic-force-microscope.html (446 words)

	IBM Research \| Almaden Research Center \| Science and Technology \| Nanoscale Science \| Atomic Scale Microscopy and ... (Site not responding. Last check: 2007-10-09)
		Magnetic resonance force microscopy (MRFM) is a new microscopic imaging technique that combines aspects of atomic force microscopy (AFM) with magnetic resonance imaging (MRI).
		The magnetic tip is attached to a sensitive micromechanical cantilever that will bend in response to small forces, including the magnetic forces due to the magnetic nuclei in the sample.
		This is because the forces that need to be detected are still extremely small - in the attonewton range - and because the behavior of individual spins in the presence of a nearby ferromagnetic tip is not well understood.
	www.almaden.ibm.com /st/nanoscale_science/asms/mrfm (843 words)

	Atomic Force Microscopy
		In "Contact mode" AFM a "topographical image" is produced by measuring the deflection of a small cantilever (a kind of microscopic diving board), which has a sharp probe attached to the bottom.
		As the cantilever scans the surface by the same piezo mechanism used for the STM, an image is produced, pixel by pixel, with the color of each pixel representing the height data taken at that point.
		Intermittent-contact or non-contact mode AFM differs from contact mode in that the cantilever is driven (made to oscillate) at its resonance frequency, and the amplitude of this oscillation is measured by the laser and photodiode.
	www.nanoword.net /library/def/Atomic_Force_Microscopy.htm (374 words)

	Articles - Atomic force microscope (Site not responding. Last check: 2007-10-09)
		The AFM consists of a cantilever with a sharp tip at its end, typically composed of silicon or silicon nitride with tip sizes on the order of nanometers.
		The Van der Waals force between the tip and the sample leads to a deflection of the cantilever according to Hooke's law, where the spring constant of the cantilever is known.
		Generally, the sample is mounted on a piezoelectric tube, which can move the sample in the z direction for maintaining a constant force, and the x and y directions for scanning the sample.
	www.sinoz.com /articles/Atomic_force_microscope (780 words)

	Microscope - Atomic Force Microscopes (Site not responding. Last check: 2007-10-09)
		Studying problems in macromolecular biophysics by atomic force microscopy at the Johns Hopkins University...
		Manufacturer and provider of electron, light and atomic force microscopy supplies and laboratory equipment.
		Covers all aspects of light microscopy, electron microscopy and other forms of microscopy.
	www.microscope-resources.com /atomicforcemicroscopes (608 words)

	Reviewers' Impressions: Exploring NANOTECHNOLOGY Encyclopedia CD-ROM
		“The section on Atomic Force Microscopy was visually entertaining and in general accurate.”
		Reviewer of the Atomic Force Microscopy chapter, Exploring Nanotechnology multimedia encyclopedia.
		Reviewer of the Scanning Electron Microscopy chapter, Exploring Nanotechnology multimedia encyclopedia.
	nanotech.nanopolis.net /reviewers.html (666 words)

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