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	Auger electron - Wikipedia, the free encyclopedia
		Auger emission (pronounced Oh-zhay) is a phenomenon in physics in which the emission of an electron from an atom causes the emission of a second electron.
		Upon ejection the kinetic energy of the Auger electron corresponds to the difference between the energy of the initial electronic transition and the ionization energy for the shell from which the Auger electron was ejected.
		Auger electron spectroscopy stimulates the emission of Auger electrons by bombarding a sample with either X-rays or energetic electrons and measures the intensity of Auger electrons as a function of the Auger electron energy.
	en.wikipedia.org /wiki/Auger_Effect (278 words)

	Auger electron spectroscopy - Wikipedia, the free encyclopedia
		Auger electron spectroscopy is an analytical technique in surface chemistry and materials science.
		Auger electron spectroscopy probes the chemistry of a surface by measuring the energy of electrons emitted from that surface when it is irradiated with electron of energy in the range 2–50 keV.
		For Auger spectroscopy to be conducted the specimen chamber and spectrometer must be maintained at Ultra High Vacuum (UHV), as any gasses present will both absorb and scatter the very low energy Auger electrons as well as forming a thin 'gas layer' on the surface of the specimen degrading analytical performance.
	en.wikipedia.org /wiki/Auger_electron_spectroscopy (566 words)

	Electron Interaction with Matter: Auger Electrons (Site not responding. Last check: 2007-11-07)
		The Auger process was discovered by Pierre Auger (pronounced "O-jhay") in 1926, when he observed tracks of constant length in a cloud chamber, but Auger electrons were not used to study surfaces until the late 1950's and 60's.
		Auger electrons are electrons ejected by radiationless excitation of a target atom by the incident electron beam.
		Auger electrons are characteristic of the fine structure of the atom and have energies between 280 eV (carbon) and 2.1 keV (sulfur).
	jan.ucc.nau.edu /~wittke/Microprobe/Interact-Auger.html (579 words)

	Encyclopedia: Isomeric transition
		Electron capture is a decay mode for chemical elements that will occur when there are too many protons in the nucleus of an atom, and there isnt enough energy to emit a positron.
		In internal conversion, the excited nucleus transfers its energy directly to one of the most tightly bound electrons causing it to be ejected from the atom.
		After the ejection of the internal conversion electron the vacancy is filled by another shell electron and the atom ejects one or several x-rays or Auger electrons.
	www.nationmaster.com /encyclopedia/Isomeric-transition (827 words)

	Radiation
		2.1.6 Ionization, Emission of Auger Electrons and X-rays
		Figure 2.6 Scanning electron micrographs of (a) the back-scattered electrons from the polished surface of the Murchison meteorite, and (b) the secondary electrons from the surface of a powder mainly of Linde A zeolite.
		Figure 2.7 Ionization of an electron of the K shell by a primary electron (a) or a photon (b), and subsequent emission of a photon (c) or an Auger electron (d).
	cars9.uchicago.edu /JoeSmith/radiation.htm (10292 words)

	AUGER
		Auger Electron Spectroscopy (AES) is an analytical technique that uses a primary electron beam to probe the surface of a solid material.
		Auger electrons are emitted at discrete energies that allow the atom of origin to be identified.
		Excitation of the atom causing emission of an electron
	www.phi.com /genf.asp?ID=281 (215 words)

	Auger Electron Spectroscopy (Site not responding. Last check: 2007-11-07)
		Auger electron spectroscopy (AES) is a surface sensitive analytical technique used mainly to determine elemental compositions of materials and, in certain cases to identify the chemical states of surface atoms.
		With AES, a primary electron beam is used to excite secondary and Auger electrons.
		Auger electrons, when analyzed as a function of energy, are used to identify the elements and chemical states present.
	cmm.mrl.uiuc.edu /techniques/auger.htm (310 words)

	IBM Research \| Almaden Research Center \| Science and Technology \| Scientific Services \| Materials Analyis \| Auger ...
		First observed by Pierre V. Auger in the 1920s, the Auger effect is a process where an atom that has been ionized with the emission of a core level electron undergoes a transition in which a second electron, the Auger electron, is emitted.
		Auger electron spectroscopy, AES, is a surface analytical technique that utilizes the Auger effect to measure the elemental composition of surfaces.
		The energy of the Auger electron, specific to the atom from which it originated, is measured and the quantity of Auger electrons is proportional to the concentration of the atoms on the surface.
	www.almaden.ibm.com /st/scientific_services/materials_analysis/auger (179 words)

	Auger Emission Spectroscopy; AES; Auger Analysis
		Auger electrons are electrons ejected in this manner, such as the third electron from L2 in the example.
		In this example, the emitted Auger electron is referred to as a KLL Auger electron.
		The depths from which Auger electrons are able to escape from the sample without losing too much energy are low, usually less than 50 angstroms.
	www.semiconfareast.com /augeranalysis.htm (509 words)

	Electron Interaction with Matter: Volume (Site not responding. Last check: 2007-11-07)
		Electron bombardment of a sample is unique to microprobe analysis and produces a large number of effects from the target material (Figure 2.1a.).
		Beam electrons lose energy as they traverse the sample due to interactions with it and if too much energy is required to produce an effect, it will not be possible to produce it from deeper portions of the volume.
		For example, although secondary and Auger electrons are produced throughout the interaction volume, they have very low energies and can only escape from a thin layer near the sample's surface.
	jan.ucc.nau.edu /~wittke/Microprobe/Interact-Effects.html (371 words)

	7.2 Electron Microscopy - SEM & SAM (Site not responding. Last check: 2007-11-07)
		As the primary electron beam is scanned across the surface, electrons of a wide range of energies will be emitted from the surface in the region where the beam is incident.
		These electrons will include backscattered primary electrons and Auger electrons, but the vast majority will be secondary electrons formed in multiple inelastic scattering processes (these are the electrons that contribute to the background and are completely ignored in Auger spectroscopy).
		The secondary electron current reaching the detector is recorded and the microscope image consists of a "plot" of this current, I, against probe position on the surface.
	www.chem.qmw.ac.uk /surfaces/scc/scat7_2.htm (423 words)

	CHP - Auger Electron Spectroscopy (Site not responding. Last check: 2007-11-07)
		Auger (pronounced ~o-jay) electron spectroscopy is an electron spectroscopic method that uses a beam of electrons to knock electrons out of inner-shell orbitals.
		Auger electrons are ejected to conserve energy when electrons in higher shells fill the vacancy in the inner shell.
		These Auger electrons have energies characteristic of the emitting atom due to the characteristic energy-level structure of that element.
	www.chem.vt.edu /chem-ed/spec/material/auger.html (71 words)

	AES (Site not responding. Last check: 2007-11-07)
		Auger Electron Spectroscopy (Auger spectroscopy or AES) was developed in the late 1960's, deriving its name from the effect first observed by Pierre Auger, a French Physicist, in the mid-1920's.
		It is a surface specific technique utilizing the emission of low energy electrons in the Auger process and is one of the most commonly employed surface analytical techniques for determining the composition of the surface layers of a sample.
		AUGER SPECTROSCOPY is based upon the measurement of the kinetic energies of the emitted electrons.
	www.jhu.edu /~chem/fairbr/surfacelab/aes.html (1113 words)

	5.2 Auger Electron Spectroscopy
		It is a surface specific technique utilising the emission of low energy electrons in the Auger process and is one of the most commonly employed surface analytical techniques for determining the composition of the surface layers of a sample.
		The Auger process is initiated by creation of a core hole - this is typically carried out by exposing the sample to a beam of high energy electrons (typically having a primary energy in the range 2 - 10 keV).
		This is an Auger spectrum of Pd metal - generated using a 2.5 keV electron beam to produce the initial core vacancies and hence to stimulate the Auger emission process.
	www.chem.qmul.ac.uk /surfaces/scc/scat5_2.htm (1110 words)

	Scanning Auger Electron Microprobe (Site not responding. Last check: 2007-11-07)
		Electrons ejected from the sample are analyzed in terms of their kinetic energy and quantity.
		Some of these electrons are characteristic Auger electrons and much like the x rays, the Auger electrons are the fingerprint of the atoms from which they are emitted.
		Because of the low kinetic energies of the ejected Auger electrons, their escape depth is limited to a few atomic layers such that one can analyze only the top atomic layers of the sample of interest.
	www.physics.montana.edu /ICAL/support/augertext.htm (231 words)

	An Introduction to AES - Auger Electron Spectroscopy
		These electrons cause core electrons from atoms contained in the sample to be ejected resulting in a photoelectron and an atom with a core hole.
		After the emission of the Auger electron, the atom is left in a doubly ionised state.
		The energy of the Auger electron is characteristic of the element that emitted it, and can thus be used to identify the element.
	www.uksaf.org /tech/aes.html (289 words)

	Specimen Interaction
		Since Auger Electrons have relatively low energy they are only emitted from the bulk specimen from a depth of <3nm, compositional information can be collected on a very small or shallow part of the specimen.
		The transmission of unscattered electrons is inversely proportional to the specimen thickness.
		Electron Energy Loss Spectroscopy: The inelastic loss of energy by the incident electrons is characteristic of the elements that were interacted with.
	www.unl.edu /CMRAcfem/interact.htm (974 words)

	jlauger (Site not responding. Last check: 2007-11-07)
		Auger Electron Spectroscopy (AES) is one of the techniques we use in our group for surface analysis.
		The kinetic energy of the Auger electron is the difference in the relaxation energy and the binding energy of the Auger electron.
		This signal intensity, plotted on the y-axis of an Auger spectrum, is the derivative of the counting rate as a function of the kinetic energy of the electron (dN(E)/dE).
	hamers.chem.wisc.edu /techniques/auger/jlauger.htm (420 words)

	Surfaces and Contact Mechanics, Part One, Page 5 (Site not responding. Last check: 2007-11-07)
		The electron gun in the figure emits electrons at a known rate and energy that are directed to the sample surface.
		The behavior of these electrons is similar to that of the specular reflection of light from a mirror or X-rays from a periodic lattice (Bragg reflection).
		The principal Auger electron energies are strongly dependent on the atomic number Z. The bold dots indicate the strongest transitions of each element.
	www.siu.edu /~cafs/surface/file5.html (1771 words)

	NREL: Measurements and Characterization - Auger Electron Spectroscopy and Scanning Auger Microscopy
		With AES, a sample surface is bombarded with a focused beam of electrons, which generates Auger electrons that are collected and measured.
		Auger electrons have discrete kinetic energies that are characteristic of the emitting atoms, making AES particularly useful for identifying elemental composition.
		A key capability of AES is the ability to focus and deflect the electron beam, thereby allowing the analyst to perform scanning Auger microscopy, which is used to generate element-specific maps.
	www.nrel.gov /measurements/auger.html (298 words)

	MMS317S Lab
		Auger electrons are emitted from a solid as a result of the ionization of the atomic core levels by an incident, energetic electron (or other ionizing) beam (Fig.
		The kinetic energy of an Auger electron is equal to the energy difference of the singly ionized initial state and the doubly ionized final state.
		A typical Auger spectrometer consists of an UHV (to maintain an uncontaminated surface during data acquisition) system, an electron gun, scanning electronics for imaging, and an electron energy analyzer and detector for the measurement and collection of emitted electrons (Fig.
	www.ecf.toronto.edu /~luzheng/Lecturenotes.htm (4643 words)

	National Synchrotron Light Source (Site not responding. Last check: 2007-11-07)
		Scientists can count the Auger electrons ejected as a function of their kinetic energy, called the Auger electron spectrum, which provides information on the correlations between the two holes left in the valence shell by the second and third electrons.
		The kinetic energy distribution of Auger electrons, called the Auger line shape, is well understood when the electron-electron correlation energies in the valence band are either very large or very small.
		Auger line shapes can be used to probe electron correlations in the valence band by comparing the measured Auger profiles against the prediction of various theories.
	www.nsls.bnl.gov /newsroom/science/2003/03-Hulbert.htm (620 words)

	Analysis Under Vacuum (Site not responding. Last check: 2007-11-07)
		It is a surface specific technique utilizing the emission of low energy electrons in the Auger process and is one of the most commonly employed surface analytical techniques.
		Electronic Structure - Solid State - In the solid state the core levels of atoms are little perturbed and essentially remain as discrete, localized (i.e.
		Auger spectra are often shown in a differentiated form: the reasons for this are partly historical, partly because it is possible to actually measure spectra directly in this form and by doing so get a better sensitivity for detection.
	www.chm.colostate.edu /erf/teaching/c532/analvac.htm (1359 words)

	Auger Electron Spectroscopy
		The backscattered and the secondary electrons are used for imaging purposes similar to that in scanning electron microscopy (SEM).
		Auger and X-ray photoelectron spectroscopy give similar information, and the choice should be based on advantages and disadvantages.
		The Auger spot size is much smaller than the XPS and has the capability of identifying fine features on the surface.
	www.ualberta.ca /ACSES/ACSES2/Techniques/AES.htm (572 words)

	Material Analytical Services
		Auger Electron Spectroscopy (AES) is the energy analysis of Auger electrons generated by a sub-micron electron beam.
		Electron Spectroscopy for Chemical Analysis (ESCA) or X-ray Photoelectron Spectroscopy (XPS), a close relative of Auger, is the energy analysis of photoelectrons generated by x-ray irradiation.
		Comparative O Auger profiles of two different Al bondpads revealing differences in the oxide thickness which might lead to differences in ball bonding behavior.
	www.mastest.com /augerxps.htm (559 words)

	Atomic, Molecular & Optical Sciences: Publications: M.H. Prior
		We have measured the anisoptropy in the Auger emission, in coincidence with measurement of the momentum transferred to the ion, which yielded the most detailed description of double electron capture in the low velocity regime.
		Since electron rearrangement is central to nearly all reactive processes, basic studies of orientation dependent electron transfer form a useful window into the correlation between structure and collision dynamics.
		Using the techniques of electron and ion momentum spectroscopy, we have measured the complete emission patterns of core photoelectrons emitted from the C and O atoms for any (and all) relative orientations of the CO molecular axis and the linearly polarization of the incident soft X-ray photons.
	www.lbl.gov /LBL-Programs/CSD/research/AMOS/projects/prior.html (1725 words)

	Auger Electron Spectroscopy AES (Site not responding. Last check: 2007-11-07)
		Auger Electron Spectroscopy is the surface sensitive method most applied to conducting samples.
		Escape depth of electrons determining the sampling depth is 1-3 nm.
		The number of characteristic Auger electrons is measured following an excitation of the surface atoms with a primary focused electron beam of 2 - 25 keV electrons.
	dmxwww.epfl.ch /lmch/mathieu/script/AES.html (407 words)

	Auger.html (Site not responding. Last check: 2007-11-07)
		In the Particle Optics group a TEM (Transmission Electron Microscope) has been redesigned so that Auger electrons (generated in the sample by the primary electron beam) can be collected with a high efficiency.
		This opens the way for Auger analysis with high spatial resolution (1 nm), as well as the possibility for coincidence measurements, where we measure the time-coincidence between energy-loss electrons and Auger electrons.
		The Auger electrons (yellow) go back up through the objective lens and are deflected off-axis for energy analysis by a combined electrostatic-magnetic deflector (green), which in first order is monochromatic: electrons within a range of energies (280..850 eV) are deflected over the same (90 degrees) angle.
	wwwdo.tn.tudelft.nl /Auger.html (1152 words)

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