| |
| | Gerd Binnig Biography | World of Invention |
 | | Binnig was born in Frankfurt am Main, then West Germany, on July 20, 1947, the son of Ruth Bracke Binnig, a drafter, and Karl Franz Binnig, a machine engineer. |
 | | While he was on leave at Stanford University in California in 1985, Binnig examined the use of the atomic force between atoms, rather than tunneling current, to move the scanning tip over a solid's surface. |
 | | Binnig shared his ideas with Christoph Gerber of IBM Zurich and Calvin Quate of Stanford, and soon they had produced a prototype of a new type of scanner, the atomic force microscope (AFM), which started a new field of microscopy. |
| www.bookrags.com /biography/gerd-binnig-woi (710 words) |
|