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| | 2003 Denver X-ray Conference - Tuesday Workshops |
 | | Blanton, Eastman Kodak Company, Rochester, NY Durst, B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI Ortega, Rigaku/MSC, The Woodlands, TX Tissot, Sandia National Laboratories, Albuquerque, NM Continuation of W-9. |
 | | T.N. Blanton, Eastman Kodak Company, Rochester, NY Durst, B.B. He, U. Preckwinkel, Bruker AXS, Inc., Madison, WI Ortega, Rigaku/MSC, The Woodlands, TX Tissot, Sandia National Laboratories, Albuquerque, NM Two-dimensional diffraction provides far more information than the conventional one-dimensional diffraction. |
 | | In recent years, usage of two-dimensional diffraction has increased due to the advances in detector technology, point beam X-ray optics, software development and computing power. |
| www.dxcicdd.com /03/wkshop-t.htm (189 words) |
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