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| | Interdisciplinary Microsystems Group |
 | | Mark Sheplak, Venkataraman Chandrasekaran, Anthony Cain, Toshikazu Nishida, and Louis Cattafesta, "Characterization of a Micromachined Thermal Shear Stress Sensor," AIAA Journal, Vol. |
 | | 17.17, Chih-Tang Sah, Calvin Y. Chao, Ann J. Chen, Charles C. Hsu, Marie S. Luo, and Toshikazu Nishida, "Hydrogenation and dehydrogenation of shallow acceptors and donors in Si: kinetic rate data," ibid., pp. |
 | | 17.14, Chih-Tang Sah, Calvin Y. Chao, Ann J. Chen, Charles C. Hsu, Marie S. Luo, and Toshikazu Nishida, "Generation-recombination-trapping of electrons and holes localized at imperfection centres in SiO2," ibid., pp. |
| www.img.ufl.edu /html/people/publications/nishida_pub.htm (1890 words) |
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