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| | Plasma-assisted chemical vapor deposition of dielectric thin films for ULSI semiconductor circuits - References |
 | | Plasma CVD papers in "Characterization of Plasma Enhanced CVD Processes," G. Lucovsky, D. Ibbotson, and D. Hess, Eds., Mater. |
 | | B. Fowler and E. O'Brien, "Relationships Between the Material Properties of Silicon Dioxide Deposited by ECR CVD and Their Use as an Indicator of the Dielectric Constants," J. Vac. |
 | | M. Kirchoff, D. Cote, M. Hauf, S. Nguyen, and W. Hoesler, "Hydrogen Content and Permeability of Thin CVD Silicon Nitride and Silicon Oxynitride Layers," Proceedings of the 192nd Meeting, The Electrochemical Society International Symposium on Chemical Vapor Deposition, Paris, France, 1997, pp. |
| www.research.ibm.com /journal/rd/431/coteref.html (5549 words) |
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