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| | Industry Study Reaffirms Reliability of Actel FPGAs Against Radiation-Induced Failures (Site not responding. Last check: 2007-11-05) |
 | | Conversely, the testing revealed volatile SRAM-based FPGAs, from vendors Altera and Xilinx, suffered a considerable number of alpha-induced configuration upsets, shedding further light on the risks posed by SRAM-based FPGAs for high-reliability applications in the commercial, military and aerospace industries. |
 | | The results of this independent study are published as an update to the report, "Radiation Results of the SER Test of Actel, Xilinx, and Altera FPGA Instances," which is available for free at http://www.actel.com/products/rescenter/ser/info.aspx. |
 | | In both cases, Actel FPGAs outperformed SRAM-based FPGAs and were able to entirely withstand the negative effects of radiation, clearly demonstrating the superiority of antifuse- and flash-based FPGA technologies over SRAM for high-reliability applications. |
| www.prnewswire.com /cgi-bin/stories.pl?ACCT=104&STORY=/www/story/03-14-2005/0003193733&EDATE= (576 words) |
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