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| | (WO/2003/007330) SAMPLE ELECTRIFICATION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM APPARATUS (Site not responding. Last check: 2007-10-13) |
 | | OSE, Yoichi [JP/JP]; c/o Instruments, Hitachi, Ltd., 882, Ichige, Hitachinaka-shi, Ibaraki 312-8504 (JP). |
 | | SATO, Takahiro [JP/JP]; c/o Instruments, Hitachi, Ltd., 882, Ichige, Hitachinaka-shi, Ibaraki 312-8504 (JP). |
 | | ASAO, Kazunari [JP/JP]; c/o Instruments, Hitachi, Ltd., 882, Ichige, Hitachinaka-shi, Ibaraki 312-8504 (JP). |
| www.wipo.int /ipdl/IPDL-CIMAGES/view/pct/getbykey5?KEY=03/07330.030123 (446 words) |
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