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| | Recent publications by IBM authors - December 17, 2001 |
 | | Exploring thin-film reactions by means of simultaneous X-ray surface roughness and resistance measurements, C. Lavoie (IBM Corp, Thomas J Watson Res Ctr, POB 218, Yorktown Hts, NY 10598 USA) et al., Defect and Diffusion Forum, 1477-1490 (2001). |
 | | Performance characterization of a data mining application via hardware-based monitoring, M. Thoennes (IBM Corp, Res, POB 218, Yorktown Hts, NY 10598 USA) and C. Weems, Proceedings of the Society of Photo-Optical Instrumentation Engineers, 109-117 (2001). |
 | | A psychophysical approach to modeling image semantics, A. Mojsilovic (IBM Corp, TJ Watson Res Ctr, 30 Saw Mill River Rd, Hawthorne, NY 10532 USA) and B. Rogowitz, Proceedings of the Society of Photo-Optical Instrumentation Engineers, 470-477 (2001). |
| www.research.ibm.com /journal/rd/recentpubs/recentpub_20011217.html (4299 words) |
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