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| | Ludwig Lab: Publications |
 | | A.S. Özcan, K.F. Ludwig, Jr., K.P. Rodbell, C. Lavoie, C. Cabral, Jr., J.M.E. Harper, J. Jordan-Sweet, "Microstructure Evolution in Ti-Ta Bilayer Films on Si(001) and Poly-Si Studied by Time-Resolved X-ray Diffraction, Light Scattering and Resistance Analysis", Science Highlights, National Synchrotron Light Source Activity Report 2001. |
 | | "Formation of a Crystalline Metal-Rich Silicide in Thin Film Titanium/Silicon Reactions", L. Clevenger, C. Cabral, R. Roy, C. Lavoie, J. Jordan-Sweet, S. Brauer, G. Morales, K. Ludwig and G.B. Stephenson, Thin Solid Films 289, 220 (1996). |
 | | "In-Situ Analysis of the Formation of Thin TiSi2 (<50 nm) Contacts in Submicron CMOS Structures During Rapid Thermal Annealing", L. Clevenger, C. Cabral, R.A. Roy, C. Lavoie, R. Viswanathan, K.L. Saenger, J. Jordan-Sweet, G. Morales, K.F. Ludwig, Jr., and G.B. Stephenson, in Silicide Thin Films, Fabrication, Properties, and Applications, ed. |
| physics.bu.edu /xrays/publications.htm (1212 words) |
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