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 | | The goal of this course is to provide students a broad and practical understanding of the ASIC design process and issues. |
 | | Fault modeling: single stuck-at fault (SSF) and multiple stuck-at fault, fault equivalence and dominance, fault simulation techniques: serial, parallel and concurrent, testing algorithms for SSF and bridge fault, functional testing, PLA testing, use of CAD tools and introduction of commercial tools and their capabilities. |
 | | Neuronal activity and mathematical models, perception type machines and learning, cerebellar models (work by Marr, Albus, Pellionisz and Llinas), parallel distributed processing (work by Hopfield, Grossberg, MeClelland and Rumelhart), and feedforward and feedback networks. |
| www.itu.edu /msce.html (1933 words) |
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