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| | Journal of Nanoelectronics and Optoelectronics |
 | | CHARACTERIZATION: materials characterization using Visible-UV PL, FTIR, Raman, STM, AFM, XPS, ESR, AES, X-ray, neutron scattering, surface electron diffraction, LEED and RHEED; structure analysis at atomic, molecular, nano and micrometer scales; electronic and phonon band structure; current-voltage, capacitance-voltage and thermal electron device characterization; optoelectronic device characterization. |
 | | PROPERTIES: Electrical, optical, optoelectronic, magnetic, chemical, thermal, mechanical and other physical properties; luminescence, dielectric and ferroelectric properties, photoconductivity; optics and nonlinear optics, photoinduced phenomena, liquid crystalline behaviors, crystallography, surface and interface properties, ultra-fast dynamics, modeling of electrical and optical properties of materials. |
| www.aspbs.com /jno.htm (543 words) |
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