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| | All Surveillance : National Institute of Standards and Technology (U.S.) |
 | | Micromachining and Microfabrication Process Technology: 23-24 October, 1995, Austin, Texas (Proceedings of Spie--the International Society of Optical Engineering, V. by: Karen W. Markus, National Institute of Standards and Technology (U. Semiconductor Equipment and Materials International, Society of Photo-Optical Instrumentation Engineers |
 | | Microelectronic Structures and Microelectromechanical Devices: 24 October, 1995, Austin, Texas (Proceedings of Spie--the International Society for Optical Engineering, V. by: Wayne E. Bailey, National Institute of Standards and Technology (U. Semiconductor Equipment and Materials International, M. |
 | | Databases available in the Research Information Center of the National Institute of Standards and Technology (NIST special publication) |
| www.all-surveillance.com /a-mode-books-search_type-AuthorSearch-input_string-National+Institute+of+Standards+and+Technology+(U.S.)-locale-us.html (381 words) |
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