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| | Optical Microscopy - Visablity |
 | | Reducing the numerical aperture of the system, usually by closing down the condenser aperture diaphragm, increases contrast in the image, but reduces resolution. |
 | | These include atomic force microscopy, in which the probe touches the surface and is moved up or down to follow the topography; thermal force microscopy, measuring surface temperature; lateral force microscopy, measuring friction; magnetic force microscopy, measuring magnetic fields; and electrostatic force microscopy, measuring charge density. |
 | | Scanning electron microscopy moves a fine beam of electrons back and forth across the, measuring back-scattered electrons, current in the object, etc. The electron microprobe is essentially a scanning electron microscope designed to produce and measure characteristic X-rays from the sample. |
| www.dyerlabs.com /microscopy/visability.html (1267 words) |
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