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| | NEW IEEE TESTING STANDARD SUPPORTS PRODUCTION OF LOW-COST PLASTIC TRANSISTORS |
 | | OFETs promise to deliver economical circuitry for high--volume |
 | | Their flexibility, light weight and low cost suggest such uses as roll-up flat panel displays, smart cards, biometric sensors and radio-frequency identification (RFID) tags for uses such as monitoring inventories, checking out groceries, tracing luggage at airports, and tracking people at secure installations. |
 | | "As OFETs move toward commercialization," he says, "material and equipment suppliers, circuit designers and system manufacturers need universal test methods so data taken at one facility can be used during the product development cycle. |
| standards.ieee.org /announcements/pr_1620.html (542 words) |
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