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| | Nanoparticle Characterization,graphs,advantages of AFM,SPM,TEM,SEM,particle volume,nanoparticle analysis |
 | | A procedure for detecting, outlining and measuring particles avoiding the impediments of the most glaring artifacts is discussed. |
 | | The particles may be visualized in a 2-D format, or a three dimensional format, Figure2. |
 | | Besides being able to analyze a singe particle, graphs may be created that show the distribution of particles as a function of any of the measured variables. |
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