| | Nikon MicroscopyU: Phase Contrast Microscopy - Introduction (Site not responding. Last check: 2007-09-18) |
 | | Phase relationships between the surround, diffracted, and particle (S, D, and P) waves in the region of the specimen at the image plane for brightfield microscopy (in the absence of phase contrast optical accessories) are presented in Figure 3. |
 | | The slight phase shift of 1/20th wavelength exhibited by the resultant particle wave (which arises from interference between the diffracted and surround waves) is typically observed for minute details in a cell, and is related to the optical path length difference. |
 | | The mechanism for generating relative phase retardation is a two-step process, with the diffracted waves being retarded in phase by a quarter wavelength at the specimen, while the surround waves are advanced (or retarded) in phase by a phase plate positioned in or very near the objective rear focal plane. |
| www.microscopyu.com /articles/phasecontrast/phasemicroscopy.html (7881 words) |