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| | College of Nanoscale Science and Engineering - Research - Profiles |
 | | Montgomery's third recent patent 7,067,227, "Sensitized chemically amplified photoresist for use in photomask fabrication and semiconductor processing," pertains to a photoresist composition and a method of using the photoresist in the fabrication of reticles or features on a semiconductor substrate. |
 | | The photoresist composition and the method are designed to reduce the variation in critical dimension of features across a surface of a substrate, where the variation in critical dimension is a result of localized resist loading. |
 | | The photoresist composition is useful when the imaging system is G-line, H-line, or I-line, and the photoresist composition includes a sensitizer which works in combination with a DUV photoresist including a PAC, to sensitize the photoresist to the G-line, H-line and I-line imaging. |
| cnse.albany.edu /research/profiles.html (771 words) |
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