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Topic: Probe microscopy

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atomic force microscopy

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scanning tunneling microscopy

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	Microscopy - Wikipedia, the free encyclopedia
		Microscopy is any technique for producing visible images of structures or details too small to otherwise be seen by the human eye, using a microscope or other magnification tool.
		Scanning probe microscopy involves the interaction of a scanning probe with the surface or object of interest.
		Optical (or light) microscopy involves passing visible light transmitted through or reflected from the subject through a series of lenses, to be detected directly by the eye, imaged on a photographic plate or captured digitally.
	en.wikipedia.org /wiki/Microscopy (2296 words)

	Scanning probe microscopy - Wikipedia, the free encyclopedia
		Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.
		An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
		SPM was founded with the invention of the scanning tunneling microscope in 1981.
	en.wikipedia.org /wiki/Scanning_probe_microscopy (245 words)

	images of nature - who we are
		Around 1980 a new revolutionary method of microscopy known as scanning probe microscopy (SPM) was invented and in a scant ten years, the applications have been increasing exponentially in fields as diverse as surface physics, chemistry, geology, biology and optics.
		B) the sample or the probe is scanned in a rastor fashion with near atomic accuracy and the variation in the interaction is translated to a topographic map of the surface.
		The probe is much like a spring which changes dimension upon experiencing a force (Hookes' law) and the interaction that will be monitored is the repulsion between two atoms when they are brought extremely close to each other.
	ion.eas.asu.edu /descript_scanprobe.htm (435 words)

	Scanning Probe Microscopy and Atomic Force Microscopy, Recent Updates and an Overview of The Technol
		This unit senses the force between the probe and the sample and provides a correction signal to the Z portion of the piezoelectric scanner (Figure 2a) to keep the force constant.
		Finally, scanning probe microscopy and AFM would not be feasible without the availability of powerful, high-speed PCs to drive the system and to process, display, and analyse the wealth of data produced.
		Scanning Electrochemical Potential Microscopy (SECPM) (patented) is in-situ imaging or potential mapping of the electrode surface by measuring the potential difference between the potentiometric probe and the sample immersed in an electrolyte solution or a polar liquid (Figure 6).
	www.azom.com /Details.asp?ArticleID=3281 (2487 words)

	Scanning Probe Microscopy
		Scanning probe microscopy covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms.
		Unfixed soft specimens are deformed in the z-dimension to a degree dependent on the imposed probe force, although spreading in the x-y plane may not be significant.
		Thus an AFM probe responds to the average force of interaction for a number of tip atoms, depending on the sharpness of the tip.
	www.mobot.org /jwcross/spm/spm-text.htm (2131 words)

	Scanning probe microscopy
		During the scan, the probe sensor samples a specific signal which is interpreted in terms of structure, electronic or force interaction information from the interface.
		The first scanning probe microscope was invented in 1982 by Binnig and Rohrer with the scanning tunneling microscope (STM) [1] for which they received the Nobel Prize in 1986 sharing it with E. Ruska for his achievements in electron optics and the invention of the electron microscope [2].
		Due to the topography of the probed sample and/or due to attractive or repulsive forces between the sample surface and the tip [21], the cantilever is bent up and down during scanning.
	www.fz-juelich.de /isg/Scanning_probe_microscopy (1465 words)

	Pharmaceutical Microscopy glossary
		The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface.
		Microscopy in which the object is examined directly by an electron beam scanning the specimen point- by- point, giving the surface image a three- dimensional quality.
		Since the vertical resolution of the surface plasmons extends from subnanometer to hundreds of nanometers, surface plasmon microscopy is potentially useful for the study of cell membranes, and transport and trafficking processes involving the membrane, as well as for studies of cell- nanofabricated surface interactions.
	www.genomicglossaries.com /content/Microscopy.asp (2773 words)

	txt001mhu: New technologies in scanning probe microscopy for studying molecular interactions in cells
		All of the micro-manipulative techniques are based on the use of a physical probe that is ‘functionalised’ with a molecule that acts as a ligand, which binds to a cell-surface receptor.
		A classical example of such a micro-manipulative approach is the use of laser tweezers to study the molecular basis of muscle contraction, during which myosin molecules move along actin filaments (Refs 7, 8); the size and direction of the forces imparted by this ‘molecular motor’ have been characterised in detail.
		Atomic force microscopy (AFM) is a specialised form of scanning probe microscopy that enables the acquisition of high-resolution topographical images of intact cells; furthermore, it allows the measurement of single molecular events under physiological conditions (Ref. 9).
	www-ermm.cbcu.cam.ac.uk /00001575h.htm (5769 words)

	Scanning Probe Techniques
		SPM was originated from the scanning tunneling microscopy (STM), in which electrical current caused by the tunneling of electron through the tip and sample is used to maintain a separation between them.
		The diversity of SPM is based on the fact that the probe tip is in contact or close to sample surface so that many interactions between the tip and sample are measurable.
		The interaction between the tip and the surface is detected by measuring the deflection of the cantilever using a laser diode to radiate the cantilever and a photodiode to detect the reflected laser beam.
	publish.uwo.ca /~hnie/spmman.html (5960 words)

	Applications of Scanned Probe Microscopy to Polymers (ACS Symposium Series 897)
		This volume — drawn from the symposium held at the March 2003 ACS Meeting in New Orleans, LA — stresses the analysis of polymer and biopolymer surfaces using the ever-expanding methodologies of scanning probe microscopies.
		A primary focus of the book is the quantitative measurement of surface properties by scanned probe techniques, which illustrates how the field has evolved and what new challenges lie ahead.
		From the Preface: “...Scanned probes offer the unique ability for in situ probing of nanoscale structure and mechanical properties, which are critical aspects of many polymer systems.
	www.polysurfacesbookstore.com /pages/3948.html (393 words)

	Weiss Group Chemistry, Physics, and Nanotechnology Publications (Site not responding. Last check: 2007-09-29)
		Probing the Atomic-Scale Chemistry and Physics of Surfaces, J. Kushmerick, Ph.D. Thesis, Department of Chemistry, The Pennsylvania State University, University Park, PA (1999).
		Probing Nanoscale Electronics Using Scanning Tunneling Microscopy, Z. Donhauser, Ph.D. Thesis, Department of Chemistry, The Pennsylvania State University, University Park, PA, USA (2003).
		Weiss, to be published in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, edited by S. Kalinin and A. Gruverman (Springer, New York, 2006), in press.
	www.nano.psu.edu /~psw/Publications.html (5358 words)

	Information about Scanning Probe Microscopy \| Information about Atomic Force Microscopy
		Atomic Force Microscopy is one of thre three most common scanning probe techniques.
		Atomic Force Microscopy measures the interaction force between the tip of the microscopy and the surface being measured.
		Scanning probe microscopy is used for imaging and measuring surfaces on a very fine level, from surfaces over 100 micrometers wide and up to 4 micrometers deep, down to the scale of individual molecules and groups of atoms.
	www.polyinsight.com /background.htm (409 words)

	Articles - Atomic force microscope (Site not responding. Last check: 2007-09-29)
		These probes are fabricated with piezoresistive elements that act as a strain gage.
		Using a Wheatstone bridge, strain in the AFM probe due to deflection can be measured, but this method is not as sensitive as the laser deflection method.
		Because most samples develop a liquid meniscus layer, keeping the probe tip close enough to the sample for these inter-atomic forces to become detectable while preventing the tip from sticking to the surface presents a major hurdle for non-contact mode in ambient conditions.
	www.zdiamond.net /articles/Atomic_force_microscope (793 words)

	Overview of Scanning Probe Microscopy Techniques
		Rather than using a beam of light or electrons, SPM uses a fine probe that is scanned over a surface (or the surface is scanned under the probe).
		By using such a probe, researchers are no longer restrained by the wavelength of light or electrons.
		Scanning Probe Microscopy is a general term, used to describe a growing number of techniques that use a sharp probe to scan over a surface and measure some property of that surface.
	www.nanoscience.com /education/tech-overview.html (197 words)

	Intro to Nanotech - Scanning Probe Microscopy (Site not responding. Last check: 2007-09-29)
		To build at the atomic level, it’s helpful to also see at that level, so scientists use Scanning Probe Microscopy (SPM): a sharp probe attached to a cantilever is scanned across a surface, and the interactions between the probe and surface of the sample are recorded and turned into an image.
		One way to do SPM is to drag the probe across the surface.
		As the probe wiggles up and down with the bumps (the blue arrows in the picture), a reflected laser also wiggles (red arrows).
	www.mos.org /cst-archive/article/3410/2.html (159 words)

	Scanning Probe Microscopy - UNIMAT - University of Nottingham
		The Nanoscience Group in Physics has established a strong reputation for its development of scanning probe techniques for the imaging, analysis and manipulation of nanostructures.
		The single-molecule resolution afforded by the scanning probe technique allows the study of the dynamic behaviour of molecules and assessments of changes in structure and function with environment such as those produced by drug molecules.
		To carry out Atomic Force Microscopy and Spectroscopy studies the group use a Molecular Force Probe from Asylum Research, and have a variety of "home-built" instruments for large sample imaging and high-resolution force spectroscopy.
	www.nottingham.ac.uk /unimat/expertise/analysis/spm.phtml (772 words)

	Open Directory - Science: Methods and Techniques: Microscopy
		Connecticut Microscopy Society - ConnMS is a group of scientists and students gathered to exchange information regarding electron, light, confocal, atomic force and fluorescence speialities.
		Magnetic Resonance Force Microscopy - MRFM is a technology for detecting the resonant force of single protons in order to image nano-structures in three dimensions.
		Polymer Microscopy - Image galleries of homogenous and heterogenous polymers using TEM, AFM and light microscopy equipment at the University of Freiburg, Germany.
	dmoz.org /Science/Methods_and_Techniques/Microscopy (459 words)

	Scanning Probe Microscopy Laboratory
		Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are the most well known SPM techniques and serve as the bases for many others.
		The SPM probe can be an atomically sharp metal tip, a pyramidal tipped silicon cantilever, a macroscopic magnetoresistive sensor, etc. These technologies contrast various electron microscopies in that they do not use electron optics or high energy focussing and probing techniques.
		Minimal sample preparation, nondestructive probing, straightforward results, atomic resolution in many instances, and the ability to sense different properties are just a few.
	www.lanl.gov /mst/SPML (175 words)

	Scanning Probe Microscopy of Environmental Interfaces
		Among these is scanning probe microscopy (SPM), a revolutionary method uniquely capable of imaging surface shapes and structures down to atomic scale.
		At Kent State University in Kent, Ohio, SPM is being used by Patricia Maurice to image and study biofilms, an important step in expanding knowledge of the environmental role of microorganisms in pollutant cycling and fate.
		"The advent of scanned probe techniques, and their ability to probe solid-liquid interfaces on an atomic scale in situ, represents one of the biggest opportunities for improving our understanding of the chemistry of environmentally important solid-liquid interfaces," said Robert J. Hamers, professor of chemistry at the University of Wisconsin, Madison.
	pubs.acs.org /hotartcl/est/98/oct/scan.html (2734 words)

	Scanning Probe Microscopy - SPM
		That concept may still be true; however, due to the delocalized nature of light, traditional optical microscopy encounters a far-field diffraction limit, which limits the resolution to half of the wavelength of light being used.
		Since the smallest frequencies of light that humans can see is around 400 nm, 200nm is the theoretical limit of simply focusing light into a human eye or detector (the practical limit is even larger).
		Scanning Probe Microscopy (SPM) is a recently developed family of techniques that can be used to produce images of nanoscale surfaces with resolution reaching down to the sub-angstrom level.
	www.nanoword.net /library/weekly/aa041600a.htm (221 words)

	Principle of Scanning Probe Microscopy (Site not responding. Last check: 2007-09-29)
		In 1986, very soon after their first publications about the STM in 1981, the inventors of this marvelous instrument, Gert Binnig and Heinrich Rohrer from the IBM Research Laboratory in Rüschlikon (Switzerland), were awarded the Nobel Prize in Physics.
		The tunneling current depends so strongly on the distance that it is dominated by the contribution flowing between the last atom of the tip and the nearest atom in the specimen.
		In the Interface Physics Group, Scanning Tunneling Microscopy is used to investigate the structure and dynamic behavior of metal surfaces.
	www.physics.leidenuniv.nl /sections/cm/ip/group/Principle_of_SPM.htm (2730 words)

	Scanning Probe Microscopy — Short Course ( University of Surrey )
		The School of Engineering offers two MSc programmes in Materials, on a full or part-time basis, and a Continuing Professional Development programme; these are well-established and sought after by students from differing educational backgrounds who value the opportunity to structure a taught programme to their individual requirements.
		The aim of this five day intensive course is to introduce the principles and practice of Scanning Tunnelling Microscopy (STM), Atomic Force Microscopy (AFM) and other methods of Scanning Probe Microscopy (SPM).
		The physical concepts employed in the instrumentation of STM and AFM are simple, but the interpretation of the STM and AFM results can be complicated because of the convolution of several interactions in the measurement process.
	www.azom.com /details.asp?ArticleID=2676 (678 words)

	Scanning Probe Microscopy
		The study of physical processes occurring at the nanometer scale or in systems with dimensions reduced to that scale has rapidly expanded during the past two decades.
		Starting with the scanning tunneling microscope, a whole family of scanning probe varieties has been and is being developed, providing unprecedented access with nanometer resolution to the structural properties as well as to the nanometer scale variations of various other physical properties, including the local electrical, magnetic and mechanical behavior.
		Tunneling and force microscopy can be applied down to liquid helium temperatures and in the presence of a magnetic field.
	fys.kuleuven.be /vsm/spm (267 words)

	MaNEP - Switzerland. Scanning probe microscopy. An eye at the nanometer scale
		In classical microscopy the resolution is however limited to the wavelength of the radiation: about half a micrometer for visible light.
		The success of this technique rapidly gave birth to a large family of instruments generally referred to as scanning probe microscopes.
		Each member of the family uses a different type of interaction between the probing tip and the sample.
	www.manep.ch /en/technological-challenges/spm.html (676 words)

	SPM Techniques - Introduction to Scanning Probe Microscopy (Site not responding. Last check: 2007-09-29)
		The first scanning probe microscope was invented in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM laboratory in Zurich.
		Since that time, a vast family of scanning probe microscopes has been spawned, a few of which are represented in this family tree.
		Each different type of SPM is characterised by the nature of the local probe and its interaction with the sample surface.
	spm.phy.bris.ac.uk /techniques (218 words)

	Scanning Probe Microscopy (SPM)
		The specimen is moved in a raster pattern by the piezoelectric scanner, and the specimen's stray fields cause shifts in the resonance of the cantilevered probe that are measured by laser detection.
		The Magnetic Force Microscopy (MFM) is an ideal way to characterize magnetic media in data storage devices (like the magnetic recording layer on a hard-disk of the disk drive on a computer).
		For example, by scanning a tiny ferromagnetic probe over a specimen, MFM maps the stray magnetic fields close to the specimen surface.
	www.engr.sjsu.edu /WofMatE/Mat'sChar2.htm (1249 words)

	Bilkent University SPM Group
		Scanning Probe Microscopy (SPM) is a technique that is used to study the properties of surfaces at the atomic level.
		A Scanning Probe Microscope scans an atomically sharp probe over a surface, typically at a distance of a few angstroms or nanometers.
		Scanning Hall probe microscopy is a promising method for the non-invasive and direct imaging of magnetic domains.
	www.fen.bilkent.edu.tr /~spm/research.htm (624 words)

	7.6 Scanning Probe Microscopy (STM / AFM)
		This invention was quickly followed by the development of a whole family of related techniques which, together with STM, may be classified in the general category of Scanning Probe Microscopy (SPM) techniques.
		All of the techniques are based upon scanning a probe (typically called the tip in STM, since it literally is a sharp metallic tip) just above a surface whilst monitoring some interaction between the probe and the surface.
		In summary, the development of the various scanning probe microscopy techniques has revolutionized the study of surface structure - atomic resolution images have been obtained not only on single crystal substrates in UHV but also on samples at atmospheric pressure and even under solution.
	www.chem.qmul.ac.uk /surfaces/scc/scat7_6.htm (1144 words)

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