| | Metrology For Information Technology - NISTIR 6025 |
 | | When test results are represented by pass/fail instead of quantitative results or when test results can not exhaustively test to an IT standard (i.e., number of possible tests are too large to economically or quickly complete), it appears that methods for establishing a level of confidence are more useful for establishing traceability in IT metrology. |
 | | Implementation whose attributes and behavior are sufficiently defined by standard(s), tested by certifiable test method(s), and traceable to standard(s) that the implementation may be used for the assessment of a measurement method or the assignment of test method values. |
 | | In the Special Tests, the reported measurement uncertainty is determined by the effects of computational roundoff and convergence settings used to generate the reference fits, the propagation of these effects through the comparison algorithms, and sampling uncertainty due to the number of data sets used to perform the test. |
| www.itl.nist.gov /lab/nistirs/ir6025.htm (7952 words) |