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Topic: Scanning electron microscopy

	CPC Sample Unit (Site not responding. Last check: 2007-10-17)
		Scanning electron microscopy is central to microstructural analysis and therefore important to any investigation relating to the processing, properties, and behavior of materials that involves their microstructure.
		The scan coils control the position of the beam on the sample and are used for scanning of the beam to produce an image, determining magnification of the image, electronic shifting of the imaged area, and positioning a probe for x-ray analysis, among other functions.
		Yacobi, B.G. and Holt, D.B. Cathodoluminescence scanning electron microscopy of semiconductors.
	www.wiley.com /cp/mmr/mmrsampl.htm (9024 words)

	[No title] (Site not responding. Last check: 2007-10-17)
		The electron gun in a scanning electron microscope is the source for the electron beam used to probe the sample.
		Electrons are emitted from a cathode, accelerated by passage through electrical fields and focussed to a first optical image of the source.
		This beam of electrons will be focussed by the shape of the field gradient to a cross-over just before the anode, forming the first optical image of the source and ensuring that a larger percentage of the electrons will pass through the aperture of the anode.
	www.sem.com /analytic/sem.htm (4648 words)

	NREL: Measurements and Characterization - Scanning Electron Microscopy
		The electron beam interacts with the material, causing a variety of signals—secondary electrons, backscattered electrons, X-rays, photons, etc.—each of which may be used to characterize a material with respect to specific properties.
		Scans the surfaces of materials with a highly focused beam of energetic electrons to produce topographical images, resolving features on the order of 2 nm.
		Through the use of electron channeling or electron backscattering diffraction, the specific crystalline type, orientation, and crystalline quality of individual crystals ("grains") in microcrystalline materials can be characterized, along with the structural properties of the grain boundaries, which are germane to polycrystalline devices.
	www.nrel.gov /measurements/scanning.html (489 words)

	Evans Analytical Group LLC (Site not responding. Last check: 2007-10-17)
		Scanning electron microscopy and electron probe microanalysis both employ focused electron beams to excite the sample and X-ray photoelectron spectroscopy employs an electron energy spectometer to measure energies of emitted electrons.
		To produce images, these electron signals are measured as a function of primary beam position while the beam is scanned in a raster pattern over the sample.
		The backscattered electrons are usually measured with a solid state detector located on the primary beam pole piece.
	www.eaglabs.com /en-US/references/tutorial/auginst/related.html (571 words)

	Transmission and scanning electron microscopy (Site not responding. Last check: 2007-10-17)
		The transmission electron microscope is an optical analogue to the conventional light microscope.
		The electrons are accelerated in a potential difference typically of the order of 10-20 keV, and the magnetic lenses form an electron spot of a size of the order of a few nm.
		In synchronism with this is an electron beam of a separate cathode-ray tube (CRT) scanned over the screen, while the intensity of the CRT is modulated by one of the signals SE, BSE, X, or SC and EBIC to form a image of the surface.
	www.inano.dk /sw261.asp (656 words)

	Scanning Electron Microscopy (Site not responding. Last check: 2007-10-17)
		In scanning electron microscopy (SEM) an electron beam is focused into a small probe and is rastered acrossed the surface of a specimen.
		Several interactions with the sample that result in the emission of electrons or photons occur as the electrons penetrate the surface.
		Scanning electron microscopy is a valuable tool for examining all manner of samples.
	cmm.mrl.uiuc.edu /techniques/sem.htm (429 words)

	Environmental Scanning Electron Microscopy - ESEM
		Bombarding the surface of a material with a beam of electrons and detecting those that are emitted or backscattered allows microscopists to see down to resolutions of 10 nanometres or so, giving them intricate details of the material’s structure.
		A well defined electron ‘probe’ is still incident on the sample, but with an accompanying ‘skirt’ of scattered electrons which can extend for tens of microns from the central probe.
		Of particular interest is the fact that ESEM may be sensitive to the electronic structure of the material, owing to the absence of a surface coating and the way that cascade amplification occurs.
	www.azom.com /details.asp?ArticleID=1556 (1917 words)

	SEM - Materials Evaluation and Engineering, Inc.
		An incident electron beam is raster-scanned across the sample's surface, and the resulting electrons emitted from the sample are collected to form an image of the surface.
		Inelastic electron scattering caused by the interaction between the sample's electrons and the incident electron beam results in the emission of low-energy electrons from near the sample's surface.
		Backscattered electrons are produced by the elastic interactions between the sample and the incident electron beam.
	www.mee-inc.com /sem.html (515 words)

	Book Review of Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed.
		Since its inception 70 years ago, the scanning electron microscope (SEM) has evolved from a simple instrument of limited use, with a resolution of about 50 nm, into a computer-equipped tool with a resolution of about 1 to 5 nm and a wide range of applications.
		The SEM is one of the most versatile instruments available for the examination and analysis of the structure (including surface topography, crystallography, and composition) of heterogeneous organic and inorganic materials on a nanometer to micrometer scale.
		Scanning Electron Microscopy and X-Ray Microanalysis is a clear and instructive introduction to this field for students in physics and materials science, as well as for practicing specialists (microscope operators and analysts) who use these methods on advanced materials and in conjunction with advanced technologies.
	www.aip.org /tip/breview/br10.html (554 words)

	JUSTNET - Scanning Electron Microscopy (Site not responding. Last check: 2007-10-17)
		The scanning electron microscope (SEM) is, next to the optical microscope, one of the most important and versatile tools available to investigators not only in forensic science but in many other disciplines in the biological and physical sciences.
		SEMs may be classified into three generations according to the type of source used to produce the electron beam.
		SEMs are very often equipped with an energy-dispersive x-ray (EDX) analysis system for the elemental analysis of specimens.
	www.nlectc.org /assistance/sem.html (424 words)

	Scanning Electron Microscopy (Site not responding. Last check: 2007-10-17)
		Electron gun: electrons are emitted from a tungsten or lanthanum hexaboride filament or a field emission source.
		EDS scans are conducted to identify/quantify the elements present in a specimen.
		It is possible to identify the composition of unknown samples by scanning calibration sources, and comparing the results to the scan of the unknown.
	www.itsc.com /sems/explanation.htm (630 words)

	Dennis McMullan Scanning Microscope
		The first scanning electron microscope with a sub-micron probe was developed by von Ardenne, a private consultant who had his own laboratory in Berlin, over the very short period of about 2 years; he also had had experience in the development of TV camera tubes (von Ardenne 1985).
		He argued that the incident beam electrons produce secondary electrons at or near the surface from an area approximately equal to the beam diameter and give a high resolution image ("nutzbare Strahlung"); the beam electrons then penetrate the sample and a proportion of them are back-scattered and reach the surface where they produce further secondaries.
		The SEM 3, which was the first fully engineered SEM, had been commissioned by Thiesmayer and Atack of the Canadian Pulp and Paper Research Institute and was used for examining wood fibres in their Ottawa laboratories: this was the earliest industrial use of an SEM on a daily basis.
	www-g.eng.cam.ac.uk /125/achievements/mcmullan/mcm.htm (5948 words)

	Reading on Electron Microscopy
		In the SEM, the image is formed and presented by a very fine electron beam, which is focused on the surface of the specimen.
		An image is built up simply by scanning the electron beam across the specimen in exact synchrony with the scan of the electron beam in the cathode ray tube.
		Bombarding a specimen with electrons causes X-rays of characteristic wavelengths and energies to be emitted from the spot where the beam strikes the specimen.
	acept.la.asu.edu /PiN/rdg/elmicr/elmicr.shtml (707 words)

	Scanning Electron Microscopy
		The sample, often gold-coated for electroconductivity, is bombarded with a focused beam of electrons which liberates secondary electrons from the sample’s surface.
		A detector in the microscope systematically “counts” these electrons, recording data on their origin and emission intensity which can then be assembled into a high contrast, high resolution image.
		Our laboratory features an ISI DS-130 scanning electron microscope with SIS Ultrascan 2 image acquisition software which is used to generate high quality digital images from the microscope.
	www.wmich.edu /bios/imgctr/SEM.htm (203 words)

	JEOL Scanning Electron Microscopes (SEM)
		SEMs are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make.
		Semi-in-Lens Cold Cathode Field Emission SEMs: highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
		Enables scanning electron microscopes (SEMs) to image and analyze wet samples such as cells, tissue biopsies, foods and ink etc., in their native environment at ambient temperature and at atmospheric pressure.
	www.jeol.com /tabid/92/Default.aspx (324 words)

	BWXT Operations - Scanning Electron Microscopy Laboratory
		Three distinct disadvantages are: the inability to reproduce color (electrons have none), the specimen must be stable under vacuum, and (in most cases) the specimen must be electrically conductive.
		Characteristic x-rays produced when the electron beam hits the sample can be used to identify and image specific elemental distributions (from boron to plutonium) in a specimen.
		The SEM is equipped for both secondary electron (SE) and backscattered electron (BSE) imaging.
	www.bwxt.com /operations/semlab.html (1401 words)

	Microstructural Analysis of Polymers Using Scanning Transmission Electron Microscopy
		The future development of new polymer materials is based on understanding their microstructures, for which electron microscopy is a fundamental tool.
		They are using a scanning transmission electron microscope system as an efficient image intensifier, which reduces the number of electrons needed for imaging.
		Scanning transmission electron microscope dark field of solvent cast polyethylene, recrystallised at 110°C. Diffraction planes 020.
	www.azom.com /details.asp?ArticleID=1769 (1158 words)

	Scanning electron microscopy
		When an electron from the beam encounters a nucleus in the sample, the resultant Coulombic attraction results in the deflection of the electron's path, known as Rutherford elastic scattering.
		Because of this, only those secondary electrons that are produced within a very short distance of the surface are able to escape from the sample.
		One of the main uses of the group's JSM 848 is the microcharacterisation of thin film solar cells.
	www.dur.ac.uk /~dph0www5/sem.html (489 words)

	Adelaide Microscopy \| Scanning Electron Microscopy
		The scanning electron microscope (SEM) is used to image the surface of a sample.
		This signal is electronically converted into an image produced on a television screen, as the electron beam scans at the same scan rate of a cathode ray tube.
		Backscattered electrons, which are reflected (elastically scattered) electrons, whose contrast function is dependent on the mean atomic number of the surface atoms, produce images which give information about elemental distribution in the sample.
	www.adelaide.edu.au /microscopy/services/instrumentation/sem.html (418 words)

	Scanning electron microscopy (SEM)
		Scanning Electron Microscopy (SEM) uses a focused electron beam to scan small areas of solid samples.
		Secondary electrons are emitted from the sample and are collected to create an area map of the secondary emissions.
		Backscattered electrons (BSE) and characteristic X-rays are also generated by the scanning beam and many instruments can utilize these signals for compositional analysis of microscopically small portions of the sample.
	www.mri.psu.edu /mcl/techniques/sem.asp (289 words)

	Scanning electron microscope - Wikipedia, the free encyclopedia
		The scanning electron microscope (SEM) is a type of electron microscope capable of producing high resolution images of a sample surface.
		The electron beam, which typically has an energy ranging from a few hundred eV to 50 keV, is focused by one or two condenser lenses into a beam with a very fine focal spot sized 1 nm to 5 nm.
		Additionally, in contrast with the case with secondary electrons, the collection efficiency of backscattered electrons cannot be significantly improved by a positive bias common on Everhart-Thornley detectors.
	en.wikipedia.org /wiki/Scanning_electron_microscope (1149 words)

	Charles Oatley: pioneer of scanning electron microscopy
		His involvement with the SEM began immediately after World War II when, fresh from his wartime experience in the development of radar, he perceived that new techniques could be brought to bear which would overcome some of the fundamental problems encountered by von Ardenne in his pre-war research on the instrument.
		The development of the SEM will forever be linked with the names of Manfred von Ardenne and Charles Oatley; but the manner of their contributions and the outcome of their work could not have been in more marked contrast.
		Although in 1935 M Knoll produced the first scanned image of a surface, it was von Ardenne who, in a relatively short burst of inspired activity just prior to World War II, laid the foundations of both transmission and surface scanning electron microscopy.
	www2.eng.cam.ac.uk /~bcb/cwo1.htm (1520 words)

	Scanning Electron Microscopy Lab at NMNH
		The SEM Lab is a multi-user, biologic imaging facility available to all the researchers at NMNH.
		The Scanning Electron Microscope (SEM) scans a beam of electrons across the surface of a sample allowing researchers to visualize the microstructural details of their objects of study.
		Browse through a gallery of images captured with the SEM to see the beauty behind some of the fascinating research ongoing at The Museum of Natural History.
	www.nmnh.si.edu /highlight/sem/highlight/SEM_main.htm (564 words)

	Empdirect - mems, scanning electron microscopy, nanotechnology, sem
		mems, scanning electron microscopy, nanotechnology, sem, electron microscopy, cryogenic, tem, mem, scanning electron microscopy, electron microscope, scanning electron microscopy, transmission electron microscope
		The use of carbon films in electron microscopy for their low background signal and relatively good electrical conductivity is well known.
		This avoids the vapor stage and mems, scanning electron microscopy, nanotechnology, sem, electron microscopy, cryogenic, tem, mem, scanning electron microscopy, electron microscope, scanning electron microscopy, transmission electron microscope reduces the distortion.
	www.empdirect.com /index-prior-3-12-2002.html (692 words)

	Detailed List of Equipment - Scanning Electron Microscopy (Site not responding. Last check: 2007-10-17)
		Scanning electron microscopy examines structure by bombarding the specimen with a scanning beam of electrons and then collecting slow moving secondary electrons that the specimen generates.
		The electron beam and the cathode ray tube scan synchronously so that an image of the surface of the specimen is formed.
		SEM is typically used to examine the external structure of objects that are as varied as biological specimens, rocks, metals, ceramics and almost anything that can be observed in a dissecting light microscope.
	www.ou.edu /research/electron/sems.html (295 words)

	Scanning Electron Microscopy and Metrology
		The SEM is currently being used extensively in the semiconductor industry as an imaging and metrology tool.
		He is the principal author of a book on the SEM, is a past president of the Microbeam Analysis Society and has been an instructor in SEM short courses for more than 25 years.
		Michael Postek is project leader for scanning electron microscope metrology in the Nano-Scale Metrology Group, Precision Engineering Division, National Institute of Standards and Technology, in Gaithersburg, MD. He has been a member of the NIST technical staff for more than 10 years.
	www.spie.org /web/meetings/programs/ml99/courses/sc21.html (367 words)

	SEM (Scanning Electron Microscopy)
		We are a full service facility involved in all steps of electron microscopy.
		Scanning electron microscopy of C. neoformans yeast cells.
		This is a comparison of thin section transmission electron microscopy (top) and scanning electron microscopy (bottom).
	www.aecom.yu.edu /aif/gallery/sem/sem.htm (293 words)

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