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Topic: Scanning probe microscopy


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In the News (Thu 17 Dec 09)

  
  Scanning Probe Microscopy
Scanning probe microscopy covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms.
Unfixed soft specimens are deformed in the z-dimension to a degree dependent on the imposed probe force, although spreading in the x-y plane may not be significant.
Thus an AFM probe responds to the average force of interaction for a number of tip atoms, depending on the sharpness of the tip.
www.mobot.org /jwcross/spm/spm-text.htm   (2131 words)

  
  Scanning Probe Microscopy of Environmental Interfaces
SPM is a family of techniques in which digital images are made on the basis of interactions between a sharp tip and a surface.
Despite its drawbacks--artifacts are common, and atomic-resolution SPM is often ambiguous with regard to exact atomic locations--the profound utility of the technique was signaled with the award of a Nobel Prize in 1986 to Gerd Binnig and Heinrich Rohrer of IBM in Zürich, Switzerland.
This expansion of the range of SPM applicability to hydrothermal reactions is of interest in environmental arenas ranging from radioactive waste storage to steam-flooding as a means of organic pollutant breakdown or recovery and in the study of silicate mineral dissolution reactions in situ.
pubs.acs.org /hotartcl/est/98/oct/scan.html   (2734 words)

  
  Scanning_probe_microscopy - The Wordbook Encyclopedia
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.
An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
SPM was founded with the invention of the scanning tunneling microscope in 1981.
www.thewordbook.com /Scanning_probe_microscopy   (296 words)

  
 Scanning probe microscopy Summary
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.
An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
SPM was founded with the invention of the scanning tunneling microscope in 1981.
www.bookrags.com /Scanning_probe_microscopy   (903 words)

  
 images of nature - who we are
SPM is also beginning to emerge as a useful and popular technique for R&D, quality control in several industries such as the semiconductor and big-technology industries.
All probe microscopes have two common features : a) a sharp, tiny probe gets very close to the sample and feels the surface by monitoring some kind of interaction, between the probe and the surface, which is very sensitive to distance.
B) the sample or the probe is scanned in a rastor fashion with near atomic accuracy and the variation in the interaction is translated to a topographic map of the surface.
ion.eas.asu.edu /descript_scanprobe.htm   (435 words)

  
 Scanning Probe Techniques
SPM was originated from the scanning tunneling microscopy (STM), in which electrical current caused by the tunneling of electron through the tip and sample is used to maintain a separation between them.
The diversity of SPM is based on the fact that the probe tip is in contact or close to sample surface so that many interactions between the tip and sample are measurable.
Schematic illustration of AFM principle: while scanning the tip across the sample surface (x, y), the system adjusts the distance (z, which is thus the measure of the height of the sample surface features) between the tip and the sample surface to maintain a constant contact force (contact mode) or oscillation amplitude (dynamic force mode).
publish.uwo.ca /~hnie/spmman.html   (6072 words)

  
 Patterns SPM Reading
Around 1980 a new revolutionary method of microscopy known as scanning probe microscopy (SPM) was invented and in a scant ten years, the applications have been increasing exponentially in fields as diverse as surface physics, chemistry, geology, biology and optics.
SPM is also beginning to emerge as a useful and popular technique for RandD, quality control in several industries such as the semiconductor and big-technology industries.
All probe microscopes have two features common features : a) a sharp, tiny probe gets very close to the sample and feels the surface by monitoring some kind of interaction, between the probe and the surface, which is very sensitive to distance.
acept.la.asu.edu /PiN/rdg/spm/spm.shtml   (731 words)

  
 Scanning Probe Microscopy   (Site not responding. Last check: )
In common with all scanning probe microscopies a tip is rastered relative to the surface and a feedback loop, typically provides an image.
NSOM is a development of scanning probe microscopy where laser light passed through a fibre optic is used to interrogate the substrate of interest.
For localised thermal analysis, the probe is placed at a selected point on the sample surface (using the topographic and thermal images as a guide) and the temperature of the probe ramped as in conventional thermal analysis.
website.lineone.net /~gilebert/afm1.htm   (780 words)

  
 Scanning Probe Microscopy
Starting with the scanning tunneling microscope, a whole family of scanning probe varieties has been and is being developed, providing unprecedented access with nanometer resolution to the structural properties as well as to the nanometer scale variations of various other physical properties, including the local electrical, magnetic and mechanical behavior.
Tunneling and force microscopy can be applied down to liquid helium temperatures and in the presence of a magnetic field.
SPM studies can be performed in ultra-high vacuum or in a controlled gas atmosphere.
fys.kuleuven.be /vsm/spm/index.html   (267 words)

  
 Books on Scanning Probe Microscopy
Probing the structural and physical properties of microbial cell surfaces
Scanning probe microscopic characterization of the higher plant cell wall and its components
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute...
mysite.verizon.net /vze3gfjm/spm/book.htm   (898 words)

  
 Overview of Scanning Probe Microscopy Techniques
Rather than using a beam of light or electrons, SPM uses a fine probe that is scanned over a surface (or the surface is scanned under the probe).
By using such a probe, researchers are no longer restrained by the wavelength of light or electrons.
Scanning Probe Microscopy is a general term, used to describe a growing number of techniques that use a sharp probe to scan over a surface and measure some property of that surface.
www.nanoscience.com /education/tech-overview.html   (198 words)

  
 Scanning Probe Microscope | USPM | Microscopy Microscopes
The USPM Model is a small sample scanning probe microscope that rasters the sample rather than the probe.
Scanning at rates as high as 20Hz are possible, greatly enhancing data acquisition times.
With Broadband Mode, the error signal generated by the shifts in cantilever angle during scanning is used to correct the scan data collected at high speed.
www.ambiostech.com /scanning_probe_microscopy_U-SPM.html   (301 words)

  
 Novel Scanning Probe Microscopy at Sandia
The experimental focus is developing scanning probe techniques, primarily atomic force microscopy, together with fluorescent optical probes, for understanding the nanoscale structural, mechanical, and dynamical properties of these systems.
These are interfaced to various scanning probe microscopes, including near-field scanning optical (NSOM), atomic force (AFM), and interfacial force (IFM).
By scanning the tip over the film, the molecular structure is altered, and the film transforms from a non-fluorescent state ("blue" form) to a fluorescent state ("red" form).
www.sandia.gov /surface_science/burns_spm/nsom.htm   (301 words)

  
 Wiley::Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition
Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines.
Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices.
Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences.
www.wiley.com /WileyCDA/WileyTitle/productCd-047124824X.html   (309 words)

  
 WWW-VL Microscopy: Scanned Probe Microscopy
SPM at UVA - SPM abstracts from University of Virginia
Scanning Probe Microscopy Home Page - SPM methods used in the study of food and agricultural biological systems
Scanning Tunneling Microscopy Tutorial - student module from Department of Chemistry and Biochemistry, University of Guelph, Canada
www.ou.edu /research/electron/www-vl/afm.shtml   (369 words)

  
 RHK Technology - Scanning Probe Microscopy Equipment - Home
RHK Technology develops and manufactures a complete line of scanning probe microscopes for the performance and customization needs of research scientists around the world.
The SPM industry leader in innovation, reliability, open architecture, and customer support, RHK has delivered a consistently superior product for twenty years.
Our ultra-high vacuum complete SPM systems are full-featured turnkey solutions with many optional individual configurations.
www.rhk-tech.com   (155 words)

  
 MikroMasch Library on SPM (SFM/AFM, LFM, MFM...) Applications
By now Scanning Probe Microscopy family comprises more than a dozen techniques and modes, which are applied successfully to various fields of science, industry and education.
Widespread use of Scanning Probe Microscopy in a few recent years is evidenced by growing number of publications.
This section is intended to help our customers and those who are interested or engaged in Scanning Probe Microscopy investigations to navigate in the world of SPM.
www.spmtips.com /bibliography   (125 words)

  
 Russian Society of Scanning Probe Microscopy and Nanotechnology
Its role in scanning probe microscopy development may not be overestimated.
With invention of scanning atomic-force microscope by Binnig, Quate and Gerber(Phys.Rev.Lett.56,1986,930-933.
Scanning probe microscopy made a major contribution to near-field optical microscopy development.
www.nanoworld.org /english/museum.html   (337 words)

  
 Scanning Probe Microscopy
A scanning probe microscope (SPM) basically works like an old fashioned record player, where the up-down movement of the needle sent the recorded impulse through the amplifier and on to the speakers to produce music.
The areas and opportunities for investigation by SPM are vast, indeed, as they sweep across semiconductor chips, polymers, chemicals, coatings, paper, metals, ceramics, magnetic and recording materials, medicines, biological substances, cells, tissues, films, on and on through the natural and applied sciences.
SPM technology's ancestor, STM Scanning Tunneling Microscopy, was invented in 1981 by Gerd Binnig and Heinrich Rohrer at IBM in Zurich, Switzerland.
www.alphacontec.de /ac/spm-tech.php   (388 words)

  
 Scanning probe microscopy
During the scan, the probe sensor samples a specific signal which is interpreted in terms of structure, electronic or force interaction information from the interface.
The first scanning probe microscope was invented in 1982 by Binnig and Rohrer with the scanning tunneling microscope (STM) [1] for which they received the Nobel Prize in 1986 sharing it with E. Ruska for his achievements in electron optics and the invention of the electron microscope [2].
Due to the topography of the probed sample and/or due to attractive or repulsive forces between the sample surface and the tip [21], the cantilever is bent up and down during scanning.
www.fz-juelich.de /isg/index.php?index=208   (1465 words)

  
 Scanning Probe Microscopy Laboratory
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are the most well known SPM techniques and serve as the bases for many others.
The SPM probe can be an atomically sharp metal tip, a pyramidal tipped silicon cantilever, a macroscopic magnetoresistive sensor, etc. These technologies contrast various electron microscopies in that they do not use electron optics or high energy focussing and probing techniques.
The development of SPM instruments that operate in ultrahigh vacuum, at low or high temperature, in large magnetic fields, in liquids, and other unique environments are making SPM a very useful, and often the preferred, technique for materials characterization.
www.lanl.gov /mst/SPML   (175 words)

  
 Scientist Solutions - Scanning Probe Microscopy
Scanning probe microscopy is a versatile and powerful method that uses...
Scanning probe microscopy investigation of self-organized perylenetetracarboxdiimide nanostructures at surfaces: structural and electronic properties.
A scanning probe microscopy investigation of the self-organization and...
www.scientistsolutions.com /f313-Scanning+Probe+Microscopy.html   (183 words)

  
 Scanning Probe Microscopy - 02/98 Elemental Discoveries   (Site not responding. Last check: )
Scanning probe microscopy (SPM) is a powerful three-dimensional technique for studying structures and physical properties of microscopic surfaces including drugs and proteins down to the atomic scale.
Scanning probe microscopes are based around a piezoelectric crystal, which moves a tiny atom-sized tip that, not surprisingly, "scans" a surface.
The tip bobs along the electron cloud of the surface and the signal it passes back to the microscope is interpreted as a three-dimensional map of the material's surface to atomic resolution.
www.sciencebase.com /scanning_probe_microscopy.html   (445 words)

  
 Scanning Probe Microscopy   (Site not responding. Last check: )
Scanning probe microscopy is a promising technique for real space imaging of solid surfaces with atomic resolution under various atmospheric conditions.
Also, the scanning probe microscope allows the selective manipulation of single atoms on a solid surface.
In addition, many research groups at the Institute are engaged in studies employing scanning probe microscopes to determine the surface structure of carbon nanotubes and organic thin films.
www.aist.go.jp /NIMC/overview/v11.html   (157 words)

  
 Scanning Probe Microscopy - UNIMAT - University of Nottingham
Scanning capacitance microscopy - a scanning capacitance microscope (SCM) is currently being constructed to operate at low temperatures (down to 1.5K) and in high magnetic fields (up to 12T).
SPM control system - one of the most important components of a scanning probe microscope is the control electronics and software.
The single-molecule resolution afforded by the scanning probe technique allows the study of the dynamic behaviour of molecules and assessments of changes in structure and function with environment such as those produced by drug molecules.
www.nottingham.ac.uk /unimat/expertise/analysis/spm.phtml   (772 words)

  
 Scanning Probe Microscopy in Oxford - Microscopy and Analysis   (Site not responding. Last check: )
Rachel Oliver (Univ. Cambridge) discussed the use of scanning capacitance, conductive and spreading resistance probe microscopies in the electrical and structural characterization of large bandgap gallium nitride semiconductors, which are used in light emitting diodes and laser diodes.
Charles Parkinson (GlaxoSmithKline, Weybridge) explained the utility of SPM in research on the structural and chemical properties of dentine and enamel.
SPM studies of transport mechanisms in carbon nanotubes reveal that electron and heat transport is ballistic, reported Lizzie Brown (National Physical Laboratory, Teddington).
www.microscopy-analysis.com /item/233/pg_dtl_art_news/pg_hdr_art/pg_ftr_art   (607 words)

  
 SPM Techniques - Introduction to Scanning Probe Microscopy
The first scanning probe microscope was invented in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM laboratory in Zurich.
Since that time, a vast family of scanning probe microscopes has been spawned, a few of which are represented in this family tree.
Each different type of SPM is characterised by the nature of the local probe and its interaction with the sample surface.
spm.phy.bris.ac.uk /techniques   (218 words)

  
 Science Stuff: Books: Scanning Probe Microscopy: The Lab on a Tip
Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts.
The intention is to provide a general textbook for all types of classes that address scanning probe microscopy.
Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy.
www.sciencestuff.com /amazon/shop.php?mode=Books&node=13850&item=3540431802   (348 words)

  
 Scanning Probe Microscopy ( SPM ) - Principles and Modes of Operation
Activities for manipulation of atom and molecules at the nanoscale level are dominated by the use of scanning probe microscopes in ultra-high vacuum.
Scanning Probe Microscopy (SPM) is a technique that is used to study the properties of surfaces at the atomic level.
Unlike conventional microscopy, which uses light waves for imaging, SPM involves scanning the surface of a sample with a very fine probe (‘tip’) and monitoring the strength of some interaction between the tip and surface.
www.azonano.com /Details.asp?ArticleID=1653   (349 words)

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