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Topic: Probe test

	International Test Solutions - Probe Card Cleaning Technology
		Probe Clean™ is a unique highly cross-linked polymeric probe needle cleaning material that is non-conductive, non-corrosive material that removes and traps the loose debris that accumulates on the probe tips and shaft.
		Probe Polish™ combines the attractive forces of Probe Clean™ with uniformly and spatially distributed abrasive particles for the added benefit of removing embedded contaminants during probe needle cleaning.
		Probe Scrub™ is a multilayer probe card cleaning medium developed for collecting particulates and debris that accumulate on probes during wafer sort and effectively removing "weld nuggets" from the probe tip contact surface.
	www.inttest.net (305 words)

	Use of PH Probe Testing in Diagnosing Asthma - National Jewish Medical and Research Center
		A pH probe will help identify if you have increased amounts of reflux and if it is causing you to have trouble breathing or other symptoms.
		Once the pH probe is placed tape will be placed around the tube and on the nose to keep the probe in place.
		Tests used to manage asthma may include a barium swallow study.
	www.njc.org /disease-info/tests/ph-probe.aspx (1133 words)

	Tektronix: Products > Probe Tutorial - Tektronix Instrument Probes: Introduction (Site not responding. Last check: 2007-10-23)
		This capability allows the distance from the probe tip to the instrument to be increased within the practical limits of the probe amplifier system and the limitations of the coaxial cable.
		Probe Loading: Input resistance and capacitance is used to describe the loading effect of a probe.
		Either the termination elements or the resistive center conductor in the probe cable limits the maximum voltage that may be applied to a probe at a specific frequency.
	www.tek.com /site/ps/0,,60-15265-INTRO_EN,00.html (2045 words)

	World Intellectual Property Organization (Site not responding. Last check: 2007-10-23)
		Probe 60 is held by guides 61 and 62, that have a coefficient of expansion similar to that of the wafer being tested.
		Probe tip 287 is preferably formed by plating the edge of a sacrificial material and then removing that material to leave a thin sheet of metal 287 projecting vertically from sheet spring 285.
		The probe of claim 1 wherein said elongated thin sheet is a substantially flat metallic foil with a longest dimension of between 150 to 1500 micrometers, and with a thickness of between 10 to 75 micrometers.
	www.wipo.int /ipdl/IPDL-CIMAGES/view/pct/getbykey5?KEY=01/84166.011108&ELEMENT_SET=DECL (8309 words)

	Marriage Test - Probe Ministries (Site not responding. Last check: 2007-10-23)
		I pray that you will use this test to alert you and your spouse to any danger signs and then begin to change your habits and actions so that your marriage will be successful.
		Probe Ministries is a non-profit ministry whose mission is to assist the church in renewing the minds of believers with a Christian worldview and to equip the church to engage the world for Christ.
		Probe fulfills this mission through our Mind Games conferences for youth and adults, our 3 1/2 minute daily radio program, and our extensive Web site at www.probe.org.
	www.probe.org /content/view/746/72 (1771 words)

	A2 Flying Probe Test Systems
		Test point densities on printed circuit boards and other interconnect substrates increase steadily and unrelentingly as do reductions in pad sizes and spacing.
		A test methodology containing throughput, high technology testability, dependability, and a superior economic model is realized by this series of flying probe test systems.
		Significantly reduced test times are realized as eight, twelve, or sixteen probes work independently of each other in small zones with little mechanical motion and at great overall speed.
	www.ectinfo.com /files/product/bareboard/a2.html (1168 words)

	Parallel Test Reduces Costs At Wafer Probe
		Testing in parallel is commonly used to increase test throughput and reduce costs.
		Massively parallel probing poses several key requirements for the tester, prober, and wafer interface: a significant systems-engineering problem that must be solved through mutual cooperation among the customer, both the tester and the prober vendors, and the wafer interface manufacturer.
		This means that the probe card, probe-card holder, and prober chuck must be robust enough to hold the wafer and probes parallel to within a few microns as the probe card moves across the wafer and the temperature of the probing environment varies.
	www.evaluationengineering.com /archive/articles/0900wafer.htm (1887 words)

	Windsor HP Probe - ASTM C-803
		The Windsor HP Probe system rapidly and accurately determines the concrete compressive strength of a structure by driving a probe into the concrete with a known amount of force.
		The probes are made of a high strength alloy, specially heat treated and annealed to achieve a hardness of Rockwell C 48.Special machining of each probe eliminates stress concentrations.
		The probes measure the strength of the actual concrete in a structure rather than that of a sample compacted and cured under strict and somewhat artificial conditions which do not necessarily represent those of the structure itself.
	www.qualitest-inc.com /windsorhpprobe.htm (981 words)

	HP 16094A - Advanced Test Equipment Rentals
		Test Fixture for measurement of circuit impedances and components mounted on circuit assemblies.
		The probe adapter unit can be attached at the tip of an extension line connected to the test port.
		Probe needle interval is variable between 1 mm to 15 mm.
	www.atecorp.com /Equipment/HP/16094A.htm (88 words)

	[No title]
		TEST 3: Serial and Address Data Communication Test Note: The serial register values are all to be loaded lsb (least significant bit) in first as indicated in the timing diagrams when writing to any register in TGL98.V2.
		Test 4 : For all tests 4.1 to 4.8 (CR3 is same)All channels enabled; mux off; Vfb=1.5v equiv(DAC=30) (Common for all tests 4.1 through 4.8) Refer to the timing diagram in FIGURE 4.0 for this part of the test.
		Test 5b: All channels at 90fC input charge, 2 fC threshold, Att=1;even channels pulsed; steepest slope; all channels enabled Refer to the Timing diagram in FIGURE 5b for this test.
	www.ornl.gov /sci/engineering_science_technology/msd/phenix/chiptest_rev2_2_99.doc (7243 words)

	Applied Precision, LLC - Semiconductor - Probe Card Analysis - ProbeWoRx FAQs
		An entire probe array of up to 300mm can be imaged in a very short time period with the high image acquisition rate of the camera and system computer.
		Test Speed - with probe card array sizes and needle counts expanding a revolutionary new technology was needed to reduce test times for large probe cards.
		Additionally these live test results are not just available on the machine, but they can be available to any number of networked client systems, which could be an engineer's desktop.
	www.api.com /semi/probeworx_faqs.html (1214 words)

	Test Probe on Alibaba.com - Find Test Probe manufacturers, suppliers, exporters, wholesalers, traders, distributors, ...
		Test Probe on Alibaba.com - Find Test Probe manufacturers, suppliers, exporters, wholesalers, traders, distributors, importers and more.
		This is your one-stop online supplier directory for Test Probe.
		Alibaba.com connects you directly to pre-qualified Test Probe manufacturers and exporters from China and around the world.
	hotproducts.alibaba.com /manufacturers-exporters/Test_Probe.html (381 words)

	[No title] (Site not responding. Last check: 2007-10-23)
		The first test of the TidBit probes in the field demonstrated similar results where a VEMCO and ONSET probe were set together at 120 fathoms in December 2000 and January 2001.
		Salinity from the YSI probe declined as expected due to increased biofouling in may and june.
		The probes were submerged in the ice bath at 2030 hours and then the solution was stirred at 2200 and allowed to melt until the units were read the following morning.
	sole.wh.whoi.edu /~jmanning/lob/probe_test.html (1229 words)

	FLEX at Wafer Probe - Teradyne, Semiconductor Test Newsletter
		Probe test has grown to over one-third of the overall test market, and new applications like System-in-Package (SiP) are driving the importance of finding "known-good-die" early in the test and manufacturing process.
		Teradyne's FLEX test platform is uniquely designed to deliver the lowest cost of test in the probe-test environment.
		Whatever devices you need to test at probe, FLEX provides the most cost-effective, solution available, for now and years from now.
	www.teradyne.com /std/newsletter/issue04/article_01_print-friendly.html (503 words)

	Sypris Test & Measurement \| Probe Selection Tips
		Before selecting a probe it is important to know the direction of the magnetic lines of flux (choose between axial or transverse), the measurement environment, and any limiting physical constraint.
		Axial probes read lines of magnetic flux through the length of the probe, while transverse probe read lines of flux moving perpendicularly (at right angles) through the tip.
		Probe Length: allows the flexibility to shorten or lengthen the stem of the probe.
	www.sypris.com /stm/content.asp?page_id=504 (197 words)

	Judge withholds tape of Waco probe field test (Site not responding. Last check: 2007-10-23)
		Sunday's test of the Forward Looking Infrared Camera at Fort Hood Army base is intended to determine the reasons behind flashes of light on FBI infrared surveillance footage taken during the final moments of the siege.
		Sunday's field test of the infrared camera is meant to show how gunfire, debris and people appear during weather and terrain conditions similar to those during the assault.
		The results of the test, in which tanks, a helicopter and camouflaged gunmen took part, are considered crucial for the plaintiffs.
	www.rickross.com /reference/waco/waco134.html (1007 words)

	Drop Testing the Huygens Probe (Site not responding. Last check: 2007-10-23)
		The Probe was released from the gondola at 11.09 a.m.
		Additional helicopter drop tests were therefore conducted and their results demonstrated that this undamped motion was not due to an interaction between the descent module's wake and the stabiliser chute.
		Further analysis of the wind conditions during the original drop test revealed that during the descent through the lower stratosphere and troposphere the wind had reached speeds of 50 m/s and there was a high wind gradient.
	esapub.esrin.esa.it /bulletin/bullet85/jakel85.htm (1676 words)

	Choosing the best IP probe for impedance test
		When measuring impedance with a Polar CITS or any other TDR probe choice is important, this application note sets out to clarify which probe is ideal and clarify some of the misunderstandings that may exist.
		The weakest link in the chain is the connection between test probe and the trace under test.
		If the probe tips are too long, or worse a wire with clip is added to the probe ripples (ringing / aberrations) will appear in the area under test, these will degrade both the measurement accuracy and repeatability.
	www.polarinstruments.com /support/cits/AP128.html (819 words)

	Applied Precision, LLC - News - Archived Press Releases
		Probing Process Analysis System, Teradyne has been able to qualify the individual performance of each component of the test system interface and assure customers that the Probe-One is immediately available for high-volume production.
		Not only did the test system side of the interface have to be qualified, but to take advantage of Probe-One's full capability, it was important to do so with the latest probe card technologies from multiple suppliers.
		Applied Precision is the leading provider of measurement, analysis and process-control systems for semiconductor test, assembly and packaging, as well as for life sciences imaging and analysis (especially cell microscopy, genomics and proteomics).
	www.api.com /news/2001/December2001_4.shtml (662 words)

	Semiconductor Tour: Wafer Probe or Test
		Wafer probe or test is the first time that chips are tested to see if they function as they were designed to do.
		Mostly, this test is performed at room temperature, but the prober is increasingly being required to also heat or cool the wafer during test.
		This is done by a probe card, whose job is to translate the small individual die pad features into connections to the tester.
	www.infras.com /Tutorial/sld018.htm (210 words)

	Test Probe Frequency Compensation
		This capacitor matches the capacity of the probe and connecting cable to the input of the oscilloscope for flat frequency response.
		The ground connection should be made as close to the test point as possible because the extra inductance of a printed circuit board or chassis wiring will have the same effect on the displayed signal as the longer ground leads-waveform distortion.
		By attaching the oscilloscope test probe to point A in the circuit, you can compare the CRT display to the waveform shown in view A. You can troubleshoot the entire circuit by comparing the waveforms at test points A, B, C, and D with that of your scope.
	www.tpub.com /celec/52.htm (662 words)

	USATODAY.com - Condit passes lie test; police probe 4 theories (Site not responding. Last check: 2007-10-23)
		WASHINGTON (AP) — Rep. Gary Condit took a lie-detector test arranged by his lawyer and it showed he "was not deceptive in any way" in denying knowledge of what happened to missing intern Chandra Levy, the lawyer said Friday.
		Police dismissed the test as "self-serving." With Condit's relationship with Levy and other women under intense media scrutiny, lawyer Abbe Lowell said that his client had cooperated fully and that police and the press should turn their attention elsewhere.
		Lowell said the test was administered by Barry D. Colvert, a polygraph expert who Lowell said teaches FBI officials how to administer the tests and has been used by the government in a number of high-profile espionage cases.
	www.usatoday.com /news/washington/july01/2001-07-13-condit-test.htm (914 words)

	State officials probe doctored test - PittsburghLIVE.com
		Machesky said he filed an educator misconduct complaint form with state education officials after a determination that the test, "in our opinion, was inappropriately administered." The complaint form stemmed from an investigation done by Tom Colebank, assistant to the superintendent, and William Dickinson, the school principal, the superintendent said.
		The superintendent said the investigation showed that a multiple-choice section of the reading test was filled in for some of the eighth-grade pupils who took it.
		Past problems with the test most often concerned a test being given at a time other than that set by state officials, she said.
	www.pittsburghlive.com /x/tribune-review/news/s_187276.html (525 words)

	IFR launches 4500 Flying Probe Test System
		Used for over 20 years to generate test programs for conventional in-circuit testing, the C-Link software automatically defines which components values are to be stimulated and measured as well as the guard points required to isolate the component electrically.
		This superior test capability is further enhanced by the ability to use functional test techniques, boundary scan and IC opens vectorless test.
		In addition, the flying probes can be augmented by the use of fixed pins to further reduce test time especially when access is provided to Vcc and GND.
	www.aeroflex.com /aboutus/pressroom/newsrelease/ifr2000/pr155.htm (404 words)

	Fiber Optics - Fiber Optic Test Probes - Glenair, Inc. (Site not responding. Last check: 2007-10-23)
		The built-in insertion and removal tool on the test probe allows for quick probing from one channel to the next with repeatable performance.
		The Glenair fiber optic test probe system has become a standard tool for the field testing of fiber optic media in front-line fighter jets and other advanced aircraft.
		The traditionally heavy and expensive test harnesses of the past are now being replaced with Glenair's lightweight and easy-to-use fiber optic test probes and adapters.
	www.glenair.com /fiberoptic/fotestprobe.html (299 words)

	Pomona Electronics - SMD Microtip Test Probe Sets
		The probe body and the plug on the other end are injection molded directly onto the wire for robust pull strength.
		The new probe sets can be used with a variety of tips to meet a wide range of test requirements including precision copper alloy tips with hard nickel plating, gold-plated pogo-pin style tips, and sharp stainless steel tips.
		Pomona Electronics has the broadest line of test accessories in the world for applications ranging from test labs to field service and plant maintenance, repair and operation and are available through the company's global distribution network.
	www.pomonaelectronics.com /html/more_whats_new/replace_tips.htm (532 words)

	Performance Characteristics and Utilization of Rapid Antigen Test, DNA Probe, and Culture for Detection of Group A ...
		test, the second was used for the probe test, and the pledget
		FP results were seen with the probe test.
		The probe test was comparable to culture in performance.
	jcm.asm.org /cgi/content/abstract/40/11/4207 (527 words)

	BEI - Flying Probe
		Flying Probe (or Fixtureless) test allows your engineers to focus their efforts on prototype design verification, instead of debugging process issues.
		Flying Probe test development is low cost and very fast, making it an ideal tool for prototype verification.
		Often used in a combinational strategy with AXI or AOI, Flying Probe allows detection and repair of electrical defects such as wrong parts, reversed parts, missing parts, solder opens, and solder bridges before they are in your engineer’s hands.
	www.bench.com /viewer/services_test-dev_flying-probe.asp (179 words)

	Comparison of IDEXX DNA probe test and three cultivation methods for detection of M. paratuberculosis in bovine feces. (Site not responding. Last check: 2007-10-23)
		Comparison of IDEXX DNA probe test and three cultivation methods for detection of M. paratuberculosis in bovine feces.
		Twenty-one of 170 fecal specimens were DNA probe test positive, whereas 35 specimens were culture positive by one or more of the methods evaluated.
		It was possible to identify cattle shedding the greatest number of organisms in 3 days using the probe test compared with a minimum of 6 weeks required for positive culture results.
	www.paratuberculosis.org /proc3/page120.htm (271 words)

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