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| | U60 data sheet - LEMSYS |
 | | With this equipment it is possible to measure the leakage current of a component, as well as to visualize its characteristics I = f(U) (ID, IR/VD, VR tests). |
 | | With these indications it is furthermore possible to better determine and optimize the protection circuits based on MOV (varistors), transils, transzorbs, etc. |
 | | It is possible, in addition, to measure and display the gate characteristics of a semiconductor by means of the IGT/VGT test. |
| www.lemsys.com /FicheU60-2print.html (526 words) |
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