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Topic: Van der Pauw method

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	Van der Pauw method - Wikipedia, the free encyclopedia
		The Van der Pauw method, developed by L.J. van der Pauw in 1958[1], is a technique for doing 4-probe resistivity and Hall effect measurements.
		Van der Pauw defines in his paper the resistance R
		Further improvement of resistance values can be obtained by repeating the resistance measurements after switching polarities of both the current source and the voltage meter, as this will cancel offset voltages as thermoelectric potentials due to the Seebeck effect.
	en.wikipedia.org /wiki/Van_der_Pauw_method (545 words)

	Printer Friendly Article (Site not responding. Last check: 2007-10-12)
		The Van der Pauw method involves applying a current and measuring voltage using four small contacts on the circumference of a flat, arbitrarily shaped sample of uniform thickness.
		Using this method, the resistivity can be derived from a total of eight measurements that are made around the periphery of the sample with the configurations shown in Figure 4.
		Van der Pauw, L. A Method of Measuring Specific Resistivity and Hall Effects of Discs of Arbitrary Shape.
	www.eurosemi.eu.com /front-end/printer-friendly.php?newsid=5596 (1499 words)

	Journal of Electronic Materials: High resistivity measurement of SiC wafers using different techniques
		To establish fast, nondestructive, and inexpensive methods for resistivity measurements of SiC wafers, different resistivity-measurement techniques were tested for characterization of semi-insulating SiC wafers, namely, the four-point probe method with removable graphite contacts, the van der Pauw method with annealed metal and diffused contacts, the current-voltage (I-V) technique, and the contactless resistivity-measurement method.
		The results are cross-referenced with van der Pauw measurements with annealed metal and diffused contacts, current-voltage (I-V) measurements, and the contactless resistivity method using the impedance spectroscopy approach.
		The four-point probe and van der Pauw measurements indicate that under the room-light illumination, the resistivity of the sample was in the range 10^sup 6^-10^sup 6^ [Omega]-cm.
	www.findarticles.com /p/articles/mi_qa3776/is_200306/ai_n9244200 (1331 words)

	[No title] (Site not responding. Last check: 2007-10-12)
		Methods for producing the organic solvent-based n- type conductive polymers of the present invention comprise exchanging the organic solvent system, preferably EG, NMP, or a mixture of the two solvents, for water in an aqueous dispersion of a conductive polymer.
		A method for producing organic solvent based n-type conductive polymers according to claim 25, wherein majority (at least 97%) of the water in the aqueous conductive polymer is removed by the solvent exchange process.
		A method for producing organic solvent based n-type conductive polymers according to claim 25, claim 26 or claim 28, wherein the aqueous conductive polymer is a substituted polythiophene.
	www.wipo.int /cgi-pct/guest/getbykey5?KEY=03/87222.031023&ELEMENT_SET=DECL (7438 words)

	PENTATEUCH - LoveToKnow Article on PENTATEUCH (Site not responding. Last check: 2007-10-12)
		In the States of the province of Holland pensionary of the order of nobles (Ridderschap) was the foremost official of that assembly and he was nameduntil the death of Oldenbarneveldt in 1619the lands advocate, or more shortly, the advocate.
		The importance of the advocate was much increased after the outbreak of the revolt in 1572, and still more so during the long period 15861619 when John van Oldenbarneveldt held the office.
		Geschiedenis der Staats-Instellingen in Nederland, The Hague, 1901; G W. Vreede, Inleiding tot eene Gesch.
	85.1911encyclopedia.org /P/PE/PENTATEUCH.htm (2439 words)

	UIUC ECE444: Silicon IC Fabrication Laboratory: Electronic Devices: Diffused Resistors
		To the right of the metal cross bridge resistors are two Van Der Pauw structures which are also used for sheet resistance measurements.
		The van der Pauw method involves forcing current through two adjacent points on the perimeter of the shape and measuring the voltage across two other points on the perimeter of the shape.
		L.J. van der Pauw, "A Method of Measuring Specific Resistivity and Hall Effect of Discs of Arbitrary Shape," Philips Research Reports, 13 (February 1958): 1-9.
	fabweb.ece.uiuc.edu /lab/devices/resistors.aspx (1033 words)

	Nanoelectronics Laboratory at the University of Cincinnati
		At Nanolab, we have a Hall and Van Der Pauw measurement system of MMR technology to characterize the electrical properties of SiC and GaN thin-films as well as the starting substrates.
		The H-50 Hall and Van Der Pauw controller provides four probe method measurements of the electrical parameters of the samples.
		This MMR's Hall System allows the user to make automatic measurements of resistivity, mobility and carrier concentration of a wide range of samples using the Van der Pauw method over a temperature range from 80 K to 400 K. The whole set up is shown in the attached picture.
	www.nanolab.uc.edu /equipment/Hall/Hall.html (199 words)

	Eddy Current Testing of Carbon-Carbon Composites by M (Site not responding. Last check: 2007-10-12)
		The four-probe measurement for obtaining the conductivity used the van der Pauw method; measurements were made concurrently with the eddy current method.
		The measurements were carried out on a 304 stainless steel sheet of thickness 0.0375" at temperatures up to 800C. Room temperature measurements by both methods* were made on 302 and 304 stainless steel sheets, and also on a pre-pyrolyzed carbon-carbon sheet of thickness 0.20.
		Room temperature simulations of the carbon-carbon were made with a sheet of 302 stainless steel of thickness 0.005", and also with three sheets of the same material of thickness 0.002" separated by paper sheets.
	www.cnde.iastate.edu /qndedatabase/Vol.11A/p0289-0297.html (387 words)

	[No title] (Site not responding. Last check: 2007-10-12)
		Van Breusegem, D. De Winter, J. Cheyns, D. Colle, S. Van den Berghe, M. Pickavet, J. Moreau, P. Demeester, "Experimentation with the ORION emulator", published in Proceedings of the 10th European Conference on Networks and Optical Communications, NOC 2005, London, UK, July 5-7, 2005, pp.
		Van Quickenborne, F. De Greve, F. De Turck, I. Moerman, P. Demeester, "Cost effective design of aggregation networks for fast moving vehicles", published in Proceedings of the 11th Symposium on Communications and Vehicular Technology in the Benelux, SCVT 2004, Gent, Belgium, 9 November 2004.
		Pollin, R. Goyens, W. Cleeren, B. Bougard, F. Catthoor, L. Van der Perre, I. Moerman, "Global energy-throughput evaluation of multihop communication for indoor IEEE 802.11a", published in Proceedings of the 11th Symposium on Communications and Vehicular Technology in the Benelux, SCVT 2004, Gent, Belgium, 9 November 2004.
	www.ibcn.intec.ugent.be /css_design/research/publications/index.php (13729 words)

	ABSTRACT (Site not responding. Last check: 2007-10-12)
		The growth methods for single crystalline MCT: in ingots with the modified Bridgman-Stockbarger technique and in epitaxial films by ISOVPE (Isothermal Vapor Phase Epitaxy) and the the necessary equipments built at PRINSO, are described.
		The structural characterization of ingots was performed observing defects and evaluating the dislocation density and misorientation between sub-boundaries (or tilts boundaries) by chemical etching and SEM, analyzing the axial and longitudinal segregations with the dispersive in wave lenght electronic microprobe (EM) and the Quant program.
		The electrical characterization (Hall-van der Pauw method) enabled to determine that the epitaxial films resulted of p type, as in case of MCT ingots, with a carriers density 6.10
	www.materia.coppe.ufrj.br /artigos/artigo10033/abstract.htm (423 words)

	van der pauw method - Article and Reference from OnPedia.com
		van der pauw method - Article and Reference from OnPedia.com
		The van der Pauw method is a technique for doing 4-probe resistivity and Hall effect measurements.
		Van der Pauw discovered that the sheet resistance of the sample could be determined from R_A and R_B using any arbitrary shape.
	www.onpedia.com /encyclopedia/van-der-pauw-method (291 words)

	6353. "Van Der Paus" structure for electrical determination of plating thickness
		"Van Der Paus" structure for electrical determination of plating thickness
		Because "Van der Waals" might have bearing on your inquiry.
		No...its definately Van der Paus, or Paws, Pause, etc...
	www.finishing.com /63/53.shtml (116 words)

	IV. Algorithm Example (Site not responding. Last check: 2007-10-12)
		van der Pauw, "A Method of Measuring Specific Resistivity and Hall Effect of Discs of Arbitrary Shapes," Philips Res.
		van der Pauw, "A Method of Measuring the Resistivity and Hall Coefficient on Lamellae of Arbitrary Shape," Philips Tech.
		Chwang, B. Smith and C. Crowell, "Contact Size Effects on the van der Pauw Method for Resistivity and Hall Coefficient Measurement," Solid-State Electronics 17, 1217-1227 (1974).
	www.eeel.nist.gov /812/references.htm (178 words)

	[No title]
		The sheet resistance and electrical activation ratio of implanted layers were examined by the van der Pauw method.
		Resistivity and Hall measurements were made using van der Pauw test structures.
		Another technique that has been reported is the amorphization method [3] in which Si-C bonds are broken by high dose ion implantation to produce an amorphous layer and this layer is subsequently removed using a wet etch.
	www.tms.org /Meetings/EMC96/abwedI.html (3851 words)

	UNO Computer Science: Materials for integrated MEMS (Site not responding. Last check: 2007-10-12)
		Pushed by the need to know such properties for the reliable optimization of IC microsystems, we have developed techniques to determine the relevant electro-thermo-mechanical properties of IC thin films.
		This line of research will be illustrated with (i) the thermal van-der-Pauw method to measure the thermal conductivity of thin films, and (ii) the mechanical instability transitions of postbuckled micromachined membranes enabling to extract mechanical thin film properties.
		Finally, I will show in which direction we are pushing the use of standard IC materials beyond current thermal limits.
	www.cs.uno.edu /special/mimems.html (215 words)

	[No title]
		FTP name this Anglo-Saxon king who ruled from 871 until 899, was succeeded by his son Edward I, and held the Danes at bay.\par \tab Answer: \ul Alfred\ulnone the Great\par \f0\par \f1 04.
		The current density associated with this phenomenon, measurement of which is often done using the van der Pauw method, is directly proportional to the product of cross-sectional area and drift velocity.
		For this effect, a few metals such as beryllium, zinc, and cadmium, are characterized by conduction of electrical current through holes which is associated with a negative value for the potential difference.
	www.stanford.edu /group/CollegeBowl/archive/berk04/final_TexasAustin.rtf (3169 words)

	Technical Journal: R&D Review of Toyota CRDL (Site not responding. Last check: 2007-10-12)
		Nitrogen-doped 6H-SiC single crystals were grown by the modified Lely method (the sublimation method).
		The crystallinity and electrical properties of the grown crystals were investigated through optical absorption measurements, Hall measurements (van der Pauw method) and etch pit measurements (the molten alkaline etching method).
		Nitrogen gas was introduced into the furnace with a partial pressure of 0.05-0.8 Torr during the crystal growth.
	www.tytlabs.co.jp /office/elibrary/ereview/rev332epdf/e332ab_okamoto.html (184 words)

	Text of MIJ-NSR Volume 1, Article 18 (Site not responding. Last check: 2007-10-12)
		The electrical properties were characterized by the Van der Pauw method at room temperature (RT).
		The optical properties were measured by photoluminescence (PL) at 77K using a CW He-Cd laser at 325 nm.
		Moreover, the barrier height was estimated, according to the method proposed by Maruska [9]and our I-V data, to be 0.7 eV, much lower than 1.
	nsr.mij.mrs.org /1/18/text.html (1225 words)

	[No title] (Site not responding. Last check: 2007-10-12)
		The heater should be turned off when its maximum temperature (~155°C) is reached in order to prevent the contacts from meltin.
		Give a brief explanation of the Van der Pauw method for measuring conductivity and the relevant equation(s) to be used.
		The Van der Pauw method uses a four-terminal configuration to measure the resistance of a sample in cases where a high degree of accuracy is needed, and/or the contact resistance is significant compared to the inherent material resistance.
	people.ccmr.cornell.edu /~mseugrad/312docs/5-1PreSol.doc (777 words)

	Opto-electronic properties of ITO/Si device (Site not responding. Last check: 2007-10-12)
		Using the simple Burstien-Moss shift model for degenerate semiconductors, an energy band gaps of about 4.0 eV is obtained.
		While electrical sheet resistance measurements are obtained using a home-made four point probe, the Hall effect measurements were performed using the standard Van der Pauw method.
		The results give a clear indication of the thickness dependence of the sheet resistance.
	wire0.ises.org /wire/doclibs/HarareConf.nsf/0276ee169edca48cc12565a000428ee8/73e3ba54b54f89dfc12565990051bdc5!OpenDocument (202 words)

	Journal of Electronic Materials: OMVPE growth of P-type GaN using solution Cp(2)Mg
		Hall measurement was performed using conventional van der Pauw method.
		The ohmic contacts were made using an indium-zinc alloy and the contacts were annealed at 500 deg C in an N^sub 2^ ambient for 2 min.
		C.G. Van de Walle, C. Stampfl, and J. Neugebauer, J. Cryst.
	www.findarticles.com /p/articles/mi_qa3776/is_200111/ai_n8995178/pg_2 (1224 words)

	Session CE - Materials Physics; Biophysics.
		The Van der Pauw method was used to determine the resistivities at room temperature of >CdSTe alloy films grown by LPVD.
		This study addresses the correlation of tack with plasticization of adhesives by the tackifier, and with two-phase morphology.
		Using the pulsed-gradient spin-echo NMR method we have studied the diffusivity D of a simple tackifier, n-butyl ester of abietic acid (BEAA) in an anionically polymerized polyisoprene (PI) melt (M near 3.10^5 Da) over the full range of concentration c at several temperatures T. Tack measurements show this combination to be only moderately effective.
	flux.aps.org /meetings/YR97/BAPSOSS97/abs/S500.html (983 words)

	Historical reprints (Site not responding. Last check: 2007-10-12)
		1917 Einstein (Physikalische Zeitschrift) Zur Quantentheorie der Strahlung.pdf
		1958 Van der Pauw (Philips Res Rep) A method of measuring specific resistivity and Hall effect of discs of arbitrary shape.pdf
		1958 Van der Pauw (Philips Tech Rev) A method of measuring the resistivity and Hall coefficient on lamellae of arbitrary shape.pdf
	www.rpi.edu /~schubert/More%20reprints/More%20reprints.htm (1198 words)

	CV Remko Scha
		Hub Prüst, Remko Scha and Martin van den Berg: "Discourse Grammar and Verb Phrase Anaphora." Linguistics and Philosophy 17 (1994), pp.
		Martin van den Berg, Rens Bod and Remko Scha: "A Corpus-Based Approach to Semantic Interpretation." In: P. Dekker and M. Stokhof (eds.): Proceedings of the Ninth Amsterdam Colloquium.
		Livia Polanyi and Remko Scha: "On the Recursive Structure of Discourse." In K. Ehlich and H. van Riemsdijk (eds.): Connectedness in Sentence, Discourse and Text.
	www.iaaa.nl /rs/science.html (3413 words)

	The van der Pauw Method (Site not responding. Last check: 2007-10-12)
		You can correct for the geometry by making measurements for the resistivity in both directions and for the hall coefficient in a crossed arrangement:
		The sheet resistivity, which yeilds the mobility, can be calculated from the van der Pauw equation:
		I've got a copy of van der Pauw's original paper
	electron.mit.edu /~gsteele/vanderpauw (113 words)

	[No title] (Site not responding. Last check: 2007-10-12)
		The parameters describing the interface roughness and mixing of these Co nanostructures are determined quantitatively in situ from the angular profile measurement of diffraction beams using high resolution, low energy electron diffraction complemented with scanning electron microscopy.
		The coercivity, magnetic anistropy, exchange coupling, magneto resistance, and magnetic inhomogeneity are obtained in situ from the surface magneto-optic Kerr effect (SMOKE), ferromagnetic resonance, and the Van der Pauw method.
		Atomic force microscopy and magnetic force microscopy provide important information on morphology and magnetic domain wall structures.
	www.cs.utexas.edu /users/yguan/NSFAbstracts/Abstracts/MPS/DMR.MPS.a9701488.txt (209 words)

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