| | Theory and Simulation of SPM |
 | | In addition to the repulsive van der Waals force described above, two other forces are generally present during contact AFM operation: a capillary force exerted by the thin water layer often present in an ambient environment, and the force exerted by the cantilever itself. |
 | | The total force that the tip exerts on the sample is the sum of the capillary plus cantilever forces, and must be balanced by the repulsive van der Waals force for contact AFM. |
 | | The magnitude of the total force exerted on the sample varies from 10-8 (with the cantilever pulling away from the sample almost as hard as the water is pulling down the tip - see Force vs. distance curves), to the more typical operating range of 10-7 to 10-6N. |
| invsee.asu.edu /nmodules/spmmod/cfm.html (899 words) |