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| | » Basics - Test Economics and Yield (Site not responding. Last check: ) |
 | | The classic equation for yield as a function of chip area (A), defect density (d, sometimes called “d-zero”), and clustering factor (a) is as follows: |
 | | In the example, only the process yield equation was used to demonstrate that adding an extra 10% to the area of the die to accomodate a test feature, for a given defect density and clustering factor, reduced the process yield by 2%. |
 | | Of course, it is also pointed out in the book (which I recommend), and I’ll repeat it here: yield is but one component of the cost/benefit analysis. There is also EDA tool costs, development time, and ATE costs, among other factors. |
| www.dftdigest.com /scanatpg/basics-test-economics-and-yield (870 words) |
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